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kA级脉冲电流注入环的电路建模与分析

董亚运 崔志同 程引会 秦锋 聂鑫

董亚运, 崔志同, 程引会, 等. kA级脉冲电流注入环的电路建模与分析[J]. 强激光与粒子束, 2022, 34: 095013. doi: 10.11884/HPLPB202234.210565
引用本文: 董亚运, 崔志同, 程引会, 等. kA级脉冲电流注入环的电路建模与分析[J]. 强激光与粒子束, 2022, 34: 095013. doi: 10.11884/HPLPB202234.210565
Dong Yayun, Cui Zhitong, Cheng Yinhui, et al. Circuit modeling and analysis of kA level pulse current injection probe[J]. High Power Laser and Particle Beams, 2022, 34: 095013. doi: 10.11884/HPLPB202234.210565
Citation: Dong Yayun, Cui Zhitong, Cheng Yinhui, et al. Circuit modeling and analysis of kA level pulse current injection probe[J]. High Power Laser and Particle Beams, 2022, 34: 095013. doi: 10.11884/HPLPB202234.210565

kA级脉冲电流注入环的电路建模与分析

doi: 10.11884/HPLPB202234.210565
基金项目: 强脉冲辐射环境模拟与效应国家重点实验室基金项目(SKLIPR1901)
详细信息
    作者简介:

    董亚运,dongyayun@nint.ac.cn

  • 中图分类号: TM27

Circuit modeling and analysis of kA level pulse current injection probe

  • 摘要: 为满足kA级脉冲电流注入应用需求,设计了一种基于非晶磁芯的电流注入环,其初级线圈采用线缆直接引出的方式,有效解决了传统注入环N型电缆接头耐压不足的问题。之后根据注入环结构建立了其电路模型,并应用粒子群优化算法确定了模型参数值。频域和时域的验证实验表明,仿真结果和实验结果具有较好的一致性,验证了该电路模型的可靠性和正确性。对注入环的实际应用场景进行了仿真分析,结果表明该电流注入环可满足实际应用中kA级脉冲电流注入的需求。
  • 图  1  PCI试验典型设置

    Figure  1.  Typical test setting of PCI

    图  2  PCI试验平台整体电路模型

    Figure  2.  Model of the integrated circuit of PCI test platform

    图  3  电流注入环结构示意图

    Figure  3.  Schematic diagram of current injection probe structure

    图  4  电流注入环电路模型

    Figure  4.  Model of the integrated circuit of current injection probe

    图  5  电流注入环输入阻抗的实验与仿真结果对比

    Figure  5.  Input impedance comparison of current injection probe between test and simulation

    图  6  频域验证结果

    Figure  6.  Frequency domain verification

    图  7  时域验证结果

    Figure  7.  Time domain verification

    图  8  仿真结果

    Figure  8.  Simulation results

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出版历程
  • 收稿日期:  2021-12-20
  • 修回日期:  2022-05-15
  • 网络出版日期:  2022-05-21
  • 刊出日期:  2022-06-17

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