Zhang Qiren, Yang Shangjin, He An, et al. IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGE[J]. High Power Laser and Particle Beams, 1992, 04: 473-476.
Citation:
Zhang Qiren, Yang Shangjin, He An, et al. IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGE[J]. High Power Laser and Particle Beams, 1992, 04: 473-476.
Zhang Qiren, Yang Shangjin, He An, et al. IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGE[J]. High Power Laser and Particle Beams, 1992, 04: 473-476.
Citation:
Zhang Qiren, Yang Shangjin, He An, et al. IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGE[J]. High Power Laser and Particle Beams, 1992, 04: 473-476.
A method of a relative calibration of SWR film used for mearuring intensity of X rays from laser produced plasma was reported in this paper. Using X rays from the plasma as a source of calibration, we have measured characteristics of Kodak SWR film produced by U.S.A. The result was used to modify the gain coefficiet of X-ray laser measured in our laboratory.
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