Method for evaluating radiation harden performance of electronic system based on system status
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摘要: 建立了一种基于状态分析的电子系统抗辐射能力评估方法，该方法以电子系统中单元器件的辐射效应实验数据为基础，采用行为级电路仿真方法对电子系统功能状态进行分析，并应用蒙特卡罗方法模拟辐射损伤随机性对系统功能状态的影响，最终结合系统功能阈值，给出系统功能的裕量及不确定度估计，进而对系统抗辐射能力进行评估。为了验证评估方法的可行性，应用该方法对某模数转换电子系统的抗总剂量能力进行了评估，并将评估结果与该电子系统的总剂量效应实验结果进行了对比。结果表明该评估方法能够定量给出系统功能在受到辐射损伤后的变化，评估方法给出结果与实验结果在变化趋势和评估结论上基本一致。Abstract: A method based on the simulation of system state is proposed to assess radiation hardened performance of electronic system. Based on radiation effects of devices of system, the system output is simulated using behavioral models which describe the electrical circuit behavior and its dependence on the radiation dose. By using Monte Carlo method, the uncertainty of system performance is calculated, then the margin and uncertainty of the system are determined. Applying the method to evaluate the radiation hardness performance of an A/D circuit illustrates the using steps of the method. The radiation experiment of the A/D circuit is performed to compare with the result given by the method.
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