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屏蔽两芯线BCI等效替代辐照理论模型研究

孙江宁 潘晓东 卢新福 万浩江 魏光辉

孙江宁, 潘晓东, 卢新福, 等. 屏蔽两芯线BCI等效替代辐照理论模型研究[J]. 强激光与粒子束, 2021, 33: 073008. doi: 10.11884/HPLPB202133.200354
引用本文: 孙江宁, 潘晓东, 卢新福, 等. 屏蔽两芯线BCI等效替代辐照理论模型研究[J]. 强激光与粒子束, 2021, 33: 073008. doi: 10.11884/HPLPB202133.200354
Sun Jiangning, Pan Xiaodong, Lu Xinfu, et al. Research on theoretical model of bulk current injection replacing radiation about shielded two-core wire[J]. High Power Laser and Particle Beams, 2021, 33: 073008. doi: 10.11884/HPLPB202133.200354
Citation: Sun Jiangning, Pan Xiaodong, Lu Xinfu, et al. Research on theoretical model of bulk current injection replacing radiation about shielded two-core wire[J]. High Power Laser and Particle Beams, 2021, 33: 073008. doi: 10.11884/HPLPB202133.200354

屏蔽两芯线BCI等效替代辐照理论模型研究

doi: 10.11884/HPLPB202133.200354
基金项目: 国家自然科学基金项目(61901521);河北省自然科学基金项目(E2019506032)
详细信息
    作者简介:

    孙江宁(1995—),男,硕士研究生,从事电磁环境效应试验技术研究

    卢新福(1988—),男,讲师,从事电磁环境效应测试与电磁兼容测试方法研究

    万浩江(1983—),男,讲师,从事电磁环境效应和电磁兼容研究

    魏光辉(1942—),男,教授,从事电磁环境效应试验与防护技术研究

    通讯作者:

    潘晓东(1980—),男,副教授,从事电磁环境效应试验方法研究

  • 中图分类号: O441, TM937

Research on theoretical model of bulk current injection replacing radiation about shielded two-core wire

  • 摘要: 针对大范围空间模拟强场电磁环境进行辐射效应试验难度大以及现有大电流注入(BCI)技术应用于非线性系统试验存在空白的问题,开展了屏蔽线耦合通道BCI等效替代辐照试验方法研究。以受试设备响应相等作为等效依据,建立了辐照法和注入法两种条件下受试设备响应的分析模型,推导出了注入激励源电压与辐照场强之间的等效对应关系,提出了BCI等效替代辐照的条件和试验方法,并进行了试验验证。研究结果表明,BCI方法是可以精确等效受试设备的辐照效应试验,试验误差不超过2 dB,能够满足工程的实际需求。
  • 图  1  屏蔽线电路示意图

    Figure  1.  Shielded wire circuit

    图  2  注入条件下屏蔽线外部电路模型

    Figure  2.  External circuit model of shielded wire under injection condition

    图  3  注入条件下屏蔽线内部原始电路

    Figure  3.  Internal origin circuit of shielded wire under injection condition

    图  4  注入条件下屏蔽线内部转换电路

    Figure  4.  Internal convertible circuit of shielded wire under injection condition

    图  5  辐照条件下屏蔽线外部电路

    Figure  5.  Shielded wire external circuit under irradiation

    图  6  源为左部分时的戴维南等效电路

    Figure  6.  Thevenin equivalent circuit when the source is the left part

    图  7  源为左部分时的最终戴维南等效电路

    Figure  7.  Final Thevenin equivalent circuit when the source is the left part

    图  8  注入条件下屏蔽线内传输线电路

    Figure  8.  Transmission line circuit in shielded line under injection condition

    图  9  屏蔽线BCI等效替代辐照试验方法

    Figure  9.  Shielded wire BCI equivalent substitute irradiation test method

    图  10  400 MHz电流探头线性度变化

    Figure  10.  400 MHz current probe linearity change

    图  11  低场强预试验

    Figure  11.  Low field intensity pre-test

    图  12  高场强外推试验

    Figure  12.  High field intensity extrapolation test

    表  1  实验结果

    Table  1.   Results of tests

    frequency/MHzP1/dBmP2/dBmE0/(V/m)kP3/dBmP4/dBmE1/(V/m)
    6928.526.74.2−14.247.84635.2
    7029.228.84.3−16.14847.434.9
    11031.320.54.7−7.157.848.697.8
    17037.422.821.53.8556.342.4188.8
    37036.616.14.7−2.748.629.320.8
    39034.218.74.1−6.445.730.717.4
    下载: 导出CSV

    表  2  实验误差

    Table  2.   Errors of tests

    frequency /MHzerror/dB
    69−0.76
    70−0.42
    110−1.77
    170−0.73
    370−0.30
    3900.56
    下载: 导出CSV
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出版历程
  • 收稿日期:  2020-12-29
  • 修回日期:  2021-06-03
  • 网络出版日期:  2021-06-25
  • 刊出日期:  2021-07-15

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