PIN diode temperature characteristics prediction based on variational mode decomposition and autoencoder
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摘要: 提出融合变分模态分解(VMD)和自编码器的预测方法,将温升特性曲线分解成若干个子信号分量,其中包含高频的波动量、中间量和低频的趋势量,然后利用自编码器对每个分量进行预测,最后将分量的预测值相加,从而实现对PIN二极管温升特性曲线的精准预测。通过与多种机器学习方法的对比验证了结合VMD分解可有效提升预测精度,同时也验证了自编码器在特性曲线拟合上的优势。Abstract: PIN diodes are critical devices for preventing damage from strong electromagnetic signals. Accurately predicting the temperature rise curve of the PIN diode has important guiding significance for selecting protective devices. Machine learning-based methods can effectively predict the characteristics of devices. However, the temperature rise characteristic curve of the PIN diode contains strong nonlinearity and small fluctuations, and traditional machine learning methods cannot predict accurately. To accurately predict the temperature rise characteristic curve of PIN diodes, this paper proposes a prediction method that combines variational mode decomposition (VMD) and autoencoder to decompose the temperature rise characteristics into sub-signals, which include high-frequency fluctuations, intermediate quantities, and low-frequency trend quantities. Then an autoencoder is used to predict each component. Finally, the predicted values of the components are added together, so as to accurately predict the temperature rise characteristic curve of the PIN diode. By comparing with various machine learning methods, it is verified that combining VMD decomposition can effectively improve prediction accuracy, and the advantage of autoencoder in fitting characteristic curves is also verified.
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表 1 实验结果
Table 1. Results of experiments
network possibility of R2 > 0.9 without VMD with VMD autoencoder 0.76 0.91 1DCNN 0.73 0.80 SVM 0.73 0.75 MLP 0.68 0.73 GRP 0.82 0.86 -
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