上海光源同步辐射空间干涉仪研制
Development of Shanghai Synchrotron Radiation Facility synchrotron radiation interferometer
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摘要: 研制了上海光源同步辐射空间干涉仪，用于储存环束团横向截面尺寸及发射度的精确测量。对干涉仪工艺设计中的光路参数、关键设备选型、数据处理方法及数据采集处理软件结构进行了分析讨论。结合束流实验完成了系统调试及运行参数优化，结果表明，CCD增益系数与曝光时间设置对测量精度有显著影响，增益系数设为0 dB，曝光时间设为200 ms时,随机测量误差可控制在μm量级。对上海光源储存环横向束斑尺寸进行了精确测量，结果表明:空间相干度曲线近似为高斯分布，可以采用单一空间频率的相干度测量值进行快速束斑尺寸计算;水平束斑尺寸实测值为52.4 μm，与理论值预期值53.0 μm相比，差异小于2%;系统测量误差约为5.5%，主要误差来源为相干度随机测量误差。Abstract: Synchrotron radiation interferometers, based on Van Citterut-Zernike theorem, are developed to measure the electron transverse beam size and emittance in the Shanghai Synchrotron Radiation Facility (SSRF) storage ring. The major engineering considerations including the optical layout, key devices, signal processing method and software architecture of data acquisition are analyzed. The system commissioning and optimization of operation parameters have been done with beam experiments. The beam experimental results show that measurement accuracy depends significantly on CCD gain and exposure time setting. Random measurement uncertainty is minimized to micron level with CCD setting of 0 dB gain and 200 ms exposure time. The electron transverse beam size of SSRF storage ring is measured precise
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