负折射率介质测试装置设计与测试
Test device for negative refractive index materials
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摘要: 为深入了解负折射率媒质的奇异传输特性，基于斯涅耳折射原理，设计并加工了一种用于测试X波段（8.2~12.4 GHz）,以亚铁磁材料为基体,内嵌金属线阵列宏结构的负折射率介质样品折射特性的实验装置。分别测试了楔形石蜡样品和楔形负折射率介质样品在X波段的折射特性,对石蜡样品测试结果的分析证明了该折射特性测试装置的有效性，对负折射率介质样品测试结果的分析证明了合成介质确实具有负折射效应。通过电磁仿真方法，测试了平行板负折射率介质的波束位移特性，进一步证明了该种合成介质的负折射特性。Abstract: To investigate the novel characteristics of negative refractive index materials(NRIMs), a test device was designed and fabricated based on the Snell law to measure the refractive characteristics of an X-band (8.2~12.4 GHz) NRIM sample consisting of ferrimagnetic materials and wire array. The refractive characteristics of the wedge-shaped paraffin sample and NRIM sample were tested with the device, respectively. The measurements of the paraffin sample demonstrate the validity of the fabricated device. The measurements of the NRIM sample exhibit the material’s negative refraction characteristic, which is then proven by the wave beam shift characteristic of the parallel-plate NRIM with electromagnetic simulations.
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