Application of stereomicroscope and CCD imaging system to spot size measurement of high-order Bessel beam
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摘要: 主要对光学测量仪器体视显微镜与CCD成像系统在高阶贝塞尔光束光斑测量中的应用进行分析,通过以非相干LED绿光经过螺旋相位板和轴棱锥产生的高阶贝塞尔(Bessel)光束为例,模拟出沿轴向不同距离处的截面光强分布图,并与相应的实验参数(如:最大无衍射距离、中心暗斑直径等)进行比较。实验结果表明,体视显微镜与CCD成像系统的测量结果相吻合,但是体视显微镜测量误差较大会影响测量结果的准确度。Abstract: This article mainly analyzed the application of optical measuring instruments, stereomicroscope and CCD imaging system to the spot measurement of high-order Bessel beam. By taking the high-order Bessel beam which is generated when incoherent LED green light is passing through the spiral phase plate and axicon as an example, we simulated the cross-section intensity distribution at different distances along the axial direction, and it is compared to corresponding experimental parameters, such as maximum non-diffracting distance, central spot diameter etc. The experimental result shows that the measurement results of stereomicroscope and CCD imaging system are in good agreement, but there are different merits and demerits between these two instruments, and the measurement error of stereomicroscope will affect the accuracy of measurement results.
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