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VUV信号强度与等离子体宏观参数相关性分析

龙飞飞 明廷凤 周凡 李凯 王智君 庄清 吴承瑞 王嵎民 黄娟 臧庆 张涛 刘海庆 高翔

龙飞飞, 明廷凤, 周凡, 等. VUV信号强度与等离子体宏观参数相关性分析[J]. 强激光与粒子束, 2018, 30: 046001. doi: 10.11884/HPLPB201830.170378
引用本文: 龙飞飞, 明廷凤, 周凡, 等. VUV信号强度与等离子体宏观参数相关性分析[J]. 强激光与粒子束, 2018, 30: 046001. doi: 10.11884/HPLPB201830.170378
Long Feifei, Ming Tingfeng, Zhou Fan, et al. Correlation of VUV intensity and basic plasma parameters[J]. High Power Laser and Particle Beams, 2018, 30: 046001. doi: 10.11884/HPLPB201830.170378
Citation: Long Feifei, Ming Tingfeng, Zhou Fan, et al. Correlation of VUV intensity and basic plasma parameters[J]. High Power Laser and Particle Beams, 2018, 30: 046001. doi: 10.11884/HPLPB201830.170378

VUV信号强度与等离子体宏观参数相关性分析

doi: 10.11884/HPLPB201830.170378
基金项目: 

国家自然科学基金项目 11605244

国家自然科学基金项目 11505221

国家磁约束核聚变能发展研究专项 2014GB106001

详细信息
    作者简介:

    龙飞飞(1991-), 女,博士研究生,主要从事边界等离子体诊断及相关物理研究;fflong@ipp.ac.cn

    通讯作者:

    明廷凤(1982-), 男,博士,主要从事边界等离子体诊断及相关物理研究;tfming@ipp.ac.cn

  • 中图分类号: O536

Correlation of VUV intensity and basic plasma parameters

  • 摘要: 东方超环(EAST)上高速真空紫外(VUV)成像系统是一套选择性测量中心波长为13.5 nm的等离子体线辐射的光学成像系统。此系统具有高时空分辨能力,主要用于边界(包括台基区)等离子体行为研究。该系统已经投入EAST等离子体物理实验并获得了大量的实验数据。基于这些数据,分析了VUV诊断系统的信号强度与等离子体宏观参数之间的相关性,着重研究了EAST上中性束注入(NBI)加热功率、杂质(碳和锂)水平、电子密度等因素对VUV信号强度的影响。结果与预期基本一致:随着NBI功率的增加,VUV信号强度随之增强;VUV信号强度与电子密度、杂质水平呈现线性关系。此外,本文还评估了由于NBI注入引起的电荷交换复合产生的C5+离子对VUV信号的贡献,结果表明这部分贡献可以忽略不计。
  • 图  1  高速VUV成像系统核心部件图

    Figure  1.  Picture of the assembled VUV high-speed imaging system

    图  2  CⅥ线辐射的光子发射率与电子温度的关系

    Figure  2.  Temperature dependence of the photon emissivity of CⅥ(p→ q=4 → 2 transition)

    图  3  NBI (A&F窗口)和VUV(D窗口)成像诊断系统相对位置示意图

    Figure  3.  Diagram of the locations of neutral beam injection(NBI) system (A&F port) and VUV camera system (D port)on EAST

    图  4  NBI加热功率对VUV信号强度的影响

    Figure  4.  Effect of NBI heating power on the VUV intensity

    图  5  不同NBI加热功率下的电子密度和电子温度分布

    Figure  5.  Typical electron density and temperature profiles with different NBI heating power

    图  6  不同NBI加热功率下的C5+离子电离平均自由程

    Figure  6.  Ionization mean free path of C5+ as a function of normalized radius of plasma with different NBI heating power

    图  7  电子密度对VUV信号强度的影响

    Figure  7.  Effect of the line-averaged electron density on VUV intensity

    图  8  CⅥ和LiⅢ线辐射水平对VUV信号强度的影响

    Figure  8.  Effect of the line radiation from C5+ and Li2+ on the VUV intensity

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    [4] Zhang Shoubiao, Gao Xiang, Ling Bili, et al. Density profile and fluctuation measurements by microwave reflectometry on EAST[J]. Plasma Science and Technology, 2014, 16(4): 311-315. doi: 10.1088/1009-0630/16/4/02
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    [7] Zhang Ling, Morita S, Xu Zong, et al. A fast-time-response extreme ultraviolet spectrometer for measurement of impurity line emissions in the Experimental Advanced Superconducting Tokamak[J]. Review of Scientific Instruments, 2015, 86(12): 123509.
    [8] 张凌, 吴振伟, 高伟, 等. EAST托卡马克等离子体可见光谱辐射研究[C]//中国核学会年会, 2009: 20-23.

    Zhang Ling, Wu Zhenwei, Gao Wei, et al. Visible spectral radiation of the plasma in EAST//Annual Academic Meeting of China Nuclear Society, 2009: 20-23
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    [15] 王骥. EAST中性束注入加热与电流驱动模拟研究[D]. 合肥: 中国科学技术大学, 2012: 58-65.

    Wang Ji. The study on simulation of heating and beam-driven current for neutral beam injection on EAST. Hefei: University of Science and Technology of China, 2012: 58-65
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出版历程
  • 收稿日期:  2017-09-19
  • 修回日期:  2017-11-29
  • 刊出日期:  2018-04-15

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