Circuit simulation of GJB151B CS115 part П: The analysis of application
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摘要: 为解决GJB151B CS115电缆束注入脉冲传导敏感度测试项目中的试验设计、效果预估等问题，在介绍不同类型受试线缆感性脉冲电流注入电路模型的基础上，仿真分析了试验设置中的各项因素（线缆设置、末端负载等）对注入到受试设备端口耦合电流/电压的影响，得到了CS115试验设置中存在的一些规律性特征，给出了应用电路仿真开展CS115试验设置分析和优化的方法。Abstract: To design the test setup and predict the effect of GJB151B CS115 “impulse excitation bulk cable injection conducted susceptibility”, we introduced the circuit model of inductive pulse current injection for different type of cables. The influences on the injected voltage/current caused by the factors of the test setup are simulated and analyzed. Some regularity characteristics of CS115 test setting are summarized, and the method of CS115 test design and optimization by circuit simulation is proposed.
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Key words:
- electromagnetic pulse /
- CS115 /
- pulsed current injection /
- inductive coupling /
- circuit modeling
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图 4 不同线缆架高下的末端负载耦合电压仿真波形
Figure 4. Simulated voltage across the terminal load (VTC)with different height of the wire
图 5 不同线缆长度下的末端负载耦合电压仿真波形
Figure 5. Simulated voltage across the terminal load (VTC)with different length of the wire
图 6 不同末端负载下的归一化耦合电压仿真波形
Figure 6. Simulated normalized voltage across the terminal load (VTC) with different values
图 7 不同注入位置下末端负载RR上的耦合电压仿真波形
Figure 7. Simulated voltage across the terminal load (VTC)with different injected point of the wire
图 8 脉冲源与电流注入环之间串联不同RB下的末端负载耦合电压仿真波形
Figure 8. Simulated normalized voltage across the terminal load (VTC) with different values of the series resistance between the impulse generator and injection probe
图 9 不同线缆数量下的负载端耦合电压仿真波形
Figure 9. Simulated voltage across the terminal load (VTC) with different number of wires
图 10 不同电缆架高下的芯线末端耦合电压仿真波形
Figure 10. Simulated voltage across the terminal load of the inner conductor (VTI) with different height of the coaxial cable
图 11 不同电缆长度下的芯线末端耦合电压仿真波形
Figure 11. Simulated voltage across the terminal load of the inner conductor (VTI) with different length of the coaxial cable
图 12 不同电缆屏蔽层末端阻抗下的芯线耦合电压仿真波形
Figure 12. Simulated voltage across the terminal load of the inner conductor (VTI) with different load impedance of the shield
图 13 不同转移阻抗下的芯线末端耦合电压仿真波形
Figure 13. Simulated voltage across the terminal load of the inner conductor (VTI) with different transfer impedance
表 1 不同线缆长度、不同注入位置下的耦合电压波形上升沿时间
Table 1. Rise time of coupling voltage with different length and injected point of the wire
lw/m rise time/ns Dinj=0.75lw Dinj=0.5lw Dinj=0.25lw Dinj=0.125lw 0.5 5 6 7 7 1.0 10 12 13 13 1.5 13 16 20 20 
下载: 导出CSV
表 2 不同型号电缆的转移阻抗参数值
Table 2. Transfer impedance of different coaxial cables
cable Rdc/mΩ Lt/nH RG-58 14.2 1.00 RG-303 14.1 0.43 RG-222 6.6 0.92 RG-316 26.8 0.88 RG-108 17.6 4.60
下载: 导出CSV
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[1] GJB 151B-2013, 军用设备和分系统电磁发射和敏感度要求与测量[S]GJB 151B-2013, Electromagnetic emission and susceptibility requirements and measurements for military equipment and subsystems[S] [2] Cui Zhitong, Grassi F, Pignari S A. Circuit modeling of the test setup for pulsed current injection[C]//Proceedings of 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility. Shenzhen, China: IEEE, 2016. [3] 崔志同, 毛从光, 孙蓓云. 感性脉冲电流注入装置的PSPICE电路建模[J]. 电子学报, 2017, 45(6):1513-1517. (Cui Zhitong, Mao Congguang, Sun Beiyun. SPICE modeling of pulsed current injection with inductive coupling[J]. Acta Electronica Sinica, 2017, 45(6): 1513-1517 doi: 10.3969/j.issn.0372-2112.2017.06.033 [4] Cui Zhitong, Grassi F, Pignari S A, et al. Pulsed current injection setup and procedure to reproduce intense transient electromagnetic disturbance[J]. IEEE Transactions on Electromagnetic Compatibility, 2018, 60(6): 2065-2068. doi: 10.1109/TEMC.2017.2789206 [5] 崔志同, 陈伟, 董亚运, 等. GJB151B CS115的电路仿真分析(一)——校准设备指标需求分析[J]. 强激光与粒子束, 2022, 34:023002. (Cui Zhitong, Chen Wei, Dong Yayun, et al. Circuit simulation of GJB151B CS115 part І: The analysis of calibration equipment indicators[J]. High Power Laser and Particle Beams, 2022, 34: 023002 doi: 10.11884/HPLPB202234.210406 [6] Cui Zhitong, Wei Bing, Grassi F, et al. Experimental analysis and circuit modeling of pulsed current injection in wire pairs[C]//Proceedings of 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility. Singapore: IEEE, 2018. [7] Grassi F, Marliani F, Pignari S A. Circuit modeling of injection probes for bulk current injection[J]. IEEE Transactions on Electromagnetic Compatibility, 2007, 49(3): 563-576. doi: 10.1109/TEMC.2007.902385 [8] Paul C R. Introduction to electromagnetic compatibility[M]. New Jersey: Wiley, 1992: 184-198. [9] Lafon F, Benlakhouy Y, De Daran F. Injection probe modeling for bulk current injection test on multi conductor transmission lines[C]//Proceedings of IEEE Symposium on Embedded EMC. Rouen, France: IEEE, 2007: 290-293. [10] 崔志同, 魏兵, 吴伟, 等. 同轴电缆感性脉冲电流注入试验仿真方法[J]. 西安电子科技大学学报, 2021, 48(4):42-49. (Cui Zhitong, Wei Bing, Wu Wei, et al. Simulation methods for inductive pulsed current injection on the coaxial cable[J]. Journal of Xidian University, 2021, 48(4): 42-49 [11] Tesche F M, Ianoz M V, Karlsson T. EMC analysis methods and computational models[M]. New York: John Wiley & Sons, Inc. , 1997. -
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