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全膜脉冲电容器电热老化分析

黄云祺 王凌云 张东东 陈林 袁建强 谢卫平 邓明海 孔佑军

黄云祺, 王凌云, 张东东, 等. 全膜脉冲电容器电热老化分析[J]. 强激光与粒子束, 2024, 36: 025020. doi: 10.11884/HPLPB202436.230163
引用本文: 黄云祺, 王凌云, 张东东, 等. 全膜脉冲电容器电热老化分析[J]. 强激光与粒子束, 2024, 36: 025020. doi: 10.11884/HPLPB202436.230163
Huang Yunqi, Wang Lingyun, Zhang Dongdong, et al. Electrical and thermal aging analysis of all-film pulsed capacitor[J]. High Power Laser and Particle Beams, 2024, 36: 025020. doi: 10.11884/HPLPB202436.230163
Citation: Huang Yunqi, Wang Lingyun, Zhang Dongdong, et al. Electrical and thermal aging analysis of all-film pulsed capacitor[J]. High Power Laser and Particle Beams, 2024, 36: 025020. doi: 10.11884/HPLPB202436.230163

全膜脉冲电容器电热老化分析

doi: 10.11884/HPLPB202436.230163
基金项目: 国家自然科学基金项目(92166106、51807185、51577178); 国防技术基础科研项目(JSJL2018212A001)
详细信息
    作者简介:

    黄云祺,1248097789@qq.com

    通讯作者:

    王凌云,101kpa@sina.com

  • 中图分类号: TM531.2;TM855

Electrical and thermal aging analysis of all-film pulsed capacitor

  • 摘要: 全膜脉冲电容器是脉冲功率系统的重要储能单元,其寿命影响着整个系统的可靠性。在脉冲工况下,全膜脉冲电容器的失效多为突发失效,且寿命的分散性较大。为探究全膜脉冲电容器老化失效机理,开展了其寿命试验及电场与温度场的仿真。利用LTD基本放电单元(Brick)实验腔体对电容器进行寿命测试并获得失效电容器,分析了失效电容在不同故障形式下的失效原因,并利用有限元分析软件对电容器局部“电场易畸变”区域进行了电场仿真,说明上述区域存在的畸变电场是发生绝缘介质击穿的主要原因;对电容器进行温度场分析,发现电容器温度与充放电频率成正相关,温度最高点位于电容器几何中心处附近,在充放电频率较低时,电容器温升不明显,说明在较低充放电频率下,电容器绝缘介质老化以电老化为主,而非热老化。
  • 图  1  寿命测试回路示意图

    Figure  1.  Schematic diagram of life testing circuit

    图  2  全膜元件圆弧处电场分布

    Figure  2.  Electric field distribution at circular arc of full film core

    图  3  电容器绝缘介质击穿示意图

    Figure  3.  Electrical breakdown photos of capacitor insulation medium

    图  4  折边与未折边的电极边缘电场分布对比

    Figure  4.  Comparison of electric field distribution at the edge of the electrode between folded and unfolded edges

    图  5  高压侧含有杂质时的畸变电场分布

    Figure  5.  Distorted electric field distribution with impurities on the high voltage side

    图  6  低压侧含有杂质时的畸变电场分布

    Figure  6.  Distorted electric field distribution with impurities on the low voltage side

    图  7  电容器绝缘材料的热老化及烧蚀

    Figure  7.  Thermal aging and ablation of capacitor insulation material

    图  8  元件上热量传递方向示意图

    Figure  8.  Schematic diagram of core heat transfer

    图  9  电容器温度变化

    Figure  9.  Temperature change under 1 Hz and 5 Hz operating conditions

    图  10  电容器温度分布图

    Figure  10.  Temperature distribution diagram of capacitor

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出版历程
  • 收稿日期:  2023-06-01
  • 修回日期:  2023-11-02
  • 录用日期:  2023-12-06
  • 网络出版日期:  2023-12-09
  • 刊出日期:  2024-01-12

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