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基于显微CT影像的靶丸表面缺陷检测方法

汤玉玲 赵庆贤 刘家铭 罗守华

汤玉玲, 赵庆贤, 刘家铭, 等. 基于显微CT影像的靶丸表面缺陷检测方法[J]. 强激光与粒子束, 2024, 36: 012001. doi: 10.11884/HPLPB202436.230257
引用本文: 汤玉玲, 赵庆贤, 刘家铭, 等. 基于显微CT影像的靶丸表面缺陷检测方法[J]. 强激光与粒子束, 2024, 36: 012001. doi: 10.11884/HPLPB202436.230257
Tang Yuling, Zhao Qingxian, Liu Jiaming, et al. Surface defect detection method for capsule based on micro-CT image[J]. High Power Laser and Particle Beams, 2024, 36: 012001. doi: 10.11884/HPLPB202436.230257
Citation: Tang Yuling, Zhao Qingxian, Liu Jiaming, et al. Surface defect detection method for capsule based on micro-CT image[J]. High Power Laser and Particle Beams, 2024, 36: 012001. doi: 10.11884/HPLPB202436.230257

基于显微CT影像的靶丸表面缺陷检测方法

doi: 10.11884/HPLPB202436.230257
基金项目: 国家自然科学基金项目(61871126);江苏省重点研发计划项目(BE2022828)
详细信息
    作者简介:

    汤玉玲,220212236@seu.edu.cn

    通讯作者:

    罗守华,luoshouhua@seu.edu.cn

  • 中图分类号: O434.12

Surface defect detection method for capsule based on micro-CT image

  • 摘要: 靶丸的内外表面缺陷分布对激光惯性约束聚变实验成功率及效率有重要影响,目前观测不透明靶丸的内表面仅有用X射线直接成像技术获取局部二维信息。运用显微CT实现靶丸三维成像,可得到靶丸内外全表面形貌信息;运用边缘检测、理想曲面拟合分割出缺陷区域,通过连通域分析对表面缺陷进行分块,并分别计算各区域的宽度、高度;运用体绘制方法交互绘制出了靶丸三维数据的立体效果,尤其突出了缺陷区域的彩色高度场效果,并通过虚拟切割观察靶丸内表面。基于该方法的靶丸内外表面缺陷观测技术,能识别大多数表面缺陷,且能较为准确地计算出缺陷尺寸参数,未识别出的缺陷通过体绘制可被观察到作为补充,为研究人员提供了良好的辅助分析手段。
  • 图  1  靶丸缺陷显微镜图像

    Figure  1.  Microscopic image of ICF capsule defects

    图  2  中间界限圆示意图

    Figure  2.  Schematic diagram of boundary circle

    图  3  缺陷分离时离散点示意图

    Figure  3.  Schematic diagram of outliers when separating defects

    图  4  缺陷参数示意图

    Figure  4.  Schematic diagram of defect parameters

    图  5  靶丸显微CT数据的外表面体绘制效果

    Figure  5.  Volume rendering images of outer surface of the micro-CT data of the capsule

    图  6  不同方式拍摄的靶丸内表面(添加20 μm微球)

    Figure  6.  The inner surface of the capsule photographed in different ways (with 20 μm microspheres)

    图  7  不同方式拍摄的靶丸内表面(添加3 μm微球)

    Figure  7.  The inner surface of the capsule photographed in different ways (with 3 μm microspheres)

    表  1  靶丸缺陷参数测量结果

    Table  1.   Measurement results of capsule defect parameters

    height of the
    defects/voxel
    measured
    height/voxel
    average error of
    height/%
    width of the
    defects/voxel
    measured
    width/voxel
    average error of
    width/%
    GT
    quantities
    measured
    quantities
    3 2.65±1.44 11.7 6 6.21±1.13 17.2 12 12
    6 6.39±1.33 6.5 12 12.38±0.69 3.1 14 13
    10 10.99±1.54 9.9 20 21.01±0.63 5.1 14 14
    下载: 导出CSV
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出版历程
  • 收稿日期:  2023-08-08
  • 修回日期:  2023-12-27
  • 录用日期:  2023-12-29
  • 网络出版日期:  2024-01-15
  • 刊出日期:  2024-01-15

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