Wavelength determination of curved spectral lines with planar crystal spectrometer
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摘要: 为了满足激光等离子体X射线光谱测量的需要，提出了一种利用平面晶体谱仪记录得到的弯曲谱线来进行波长标定的新方法。传统的参考谱线法需要已知两条以上谱线的确切波长才能进行波长标定，而利用弯曲谱线可以在不知道任何谱线信息的情况下进行波长标定。通过对实验中所获得的铝等离子体He自发射谱线弯曲图像的分析，得到在目前所使用的谱仪条件下，该方法的波长定标精度可以达到210-4 nm。Abstract: For the need of X-ray wavelength determination of laser plasma, a novel method was presented for wavelength determination by using curved spectral line measured with planar crystal spectrometer. In normal reference line method, the wavelength of more than two reference lines should be determined before wavelength determination. By using curved spectral line method, no reference line was used to determine wavelength. In this paper, curved image of He self-emission spectrum of aluminum plasma was recorded in experiment, and the uncertainty of this method using the present spectrometer was about 210-4 nm in theory.
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Key words:
- laser plasma /
- planar crystal spectrometer /
- reference lines /
- curved spectral line
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