Lifetime prediction of metallized polypropylene film capacitors in pulsed power applications

The operational factors (voltage, temperature) that influence the lifetime of metallized polypropylene film capacitor(MPPFCs) are analyzed. The relationship between MPPFC elements and MPPFC prototypes in terms of lifetime is presented by a reliability analysis of the Weibull distribution. A lifetime prediction model based on the accelerating lifetime test of the element is established. Finally, lifetime tests of MPPFC prototypes and elements are performed to validate the prediction model. The results suggest that the predicted lifetime of MPPFC elements and prototypes could match well with the experimental data.