He Peng, Wei Biao, Feng Peng, et al. K-edge imaging technique based on MARS X-ray spectral CT system[J]. High Power Laser and Particle Beams, 2014, 26: 104004. doi: 10.11884/HPLPB201426.104004
Citation:
He Peng, Wei Biao, Feng Peng, et al. K-edge imaging technique based on MARS X-ray spectral CT system[J]. High Power Laser and Particle Beams, 2014, 26: 104004. doi: 10.11884/HPLPB201426.104004
He Peng, Wei Biao, Feng Peng, et al. K-edge imaging technique based on MARS X-ray spectral CT system[J]. High Power Laser and Particle Beams, 2014, 26: 104004. doi: 10.11884/HPLPB201426.104004
Citation:
He Peng, Wei Biao, Feng Peng, et al. K-edge imaging technique based on MARS X-ray spectral CT system[J]. High Power Laser and Particle Beams, 2014, 26: 104004. doi: 10.11884/HPLPB201426.104004
The typical conventional CT system employs the digital integrating sensor, for which it is difficult to identify attenuation characteristics of different energy X-ray. This paper focuses on X-ray spectral imaging technology based on MARS X-ray spectral CT system. We scanned some singular element materials and a multi-material phantom with different energy X-ray bins, obtained some material K-edge characteristic curves, and reconstructed CT images of multi-material phantom. By means of CT images based on material K-edge characteristics, we can discriminate different materials or recognize more attenuation information of different materials. Compared to conventional X-ray CT technology, X-ray spectral CT can provide much richer attenuation information.