He Tie, An Li, Liu Meng, et al. Beam profile diagnostics based on optical imaging system[J]. High Power Laser and Particle Beams, 2014, 26: 115102. doi: 10.11884/HPLPB201426.115102
Citation:
He Tie, An Li, Liu Meng, et al. Beam profile diagnostics based on optical imaging system[J]. High Power Laser and Particle Beams, 2014, 26: 115102. doi: 10.11884/HPLPB201426.115102
He Tie, An Li, Liu Meng, et al. Beam profile diagnostics based on optical imaging system[J]. High Power Laser and Particle Beams, 2014, 26: 115102. doi: 10.11884/HPLPB201426.115102
Citation:
He Tie, An Li, Liu Meng, et al. Beam profile diagnostics based on optical imaging system[J]. High Power Laser and Particle Beams, 2014, 26: 115102. doi: 10.11884/HPLPB201426.115102
Technology index of the optical imaging system was designed for the purpose of accelerator deuterium ion beam profile measurement. ZEMAX was used to design and simulate the optical imaging system. The standard white light source and line pair board were used to check the design result. It was shown from the design result that this optical imaging system had good image quality. Distortion was lower than 0.05%. The MTFs of the center field and the edge field were higher than 0.7 with an optical resolution of 30 lp/mm. The experiment result of the optical imaging system used in the beam profile measurement showed that the diagnostic method based on scintillator screen was feasible.