Ren Qingyi, Chen Min, Huang Bin, et al. Control system and Xe-flash lamp power supply of high speed imaging for detonation experiments[J]. High Power Laser and Particle Beams, 2015, 27: 055001. doi: 10.11884/HPLPB201527.055001
Citation:
Ren Qingyi, Chen Min, Huang Bin, et al. Control system and Xe-flash lamp power supply of high speed imaging for detonation experiments[J]. High Power Laser and Particle Beams, 2015, 27: 055001. doi: 10.11884/HPLPB201527.055001
Ren Qingyi, Chen Min, Huang Bin, et al. Control system and Xe-flash lamp power supply of high speed imaging for detonation experiments[J]. High Power Laser and Particle Beams, 2015, 27: 055001. doi: 10.11884/HPLPB201527.055001
Citation:
Ren Qingyi, Chen Min, Huang Bin, et al. Control system and Xe-flash lamp power supply of high speed imaging for detonation experiments[J]. High Power Laser and Particle Beams, 2015, 27: 055001. doi: 10.11884/HPLPB201527.055001
In order to prevent the flash and shutter failure occurred in the high speed imaging of detonation experiments, this article presented a robust and reliable method by improving the test control devices and circuit of xenon lamp power supply of the high-speed imaging in experiment. Firstly, a circuit for performing logical operations was added on control signals to supervise the experiment. Secondly, the technology of a pseudospark switch and multi-section pulse forming line was used in the xenon flash lamp power supply, so that it could solve the xenon lamps self-flash, non-ignite and light intensity uneven problems. Finally, the pseudospark switch solved the process-encountered electromagnetic interference and synchronization ignition problems. In conclusion, this method effectively prevented the high-speed photography optical image missing and uneven film exposure in the detonation test. And the current article introduced the main components, circuits, systems, as well as the development process and the results of the experiment of this method.