Han Feng, Liu Yu, Wang Bin. Method for evaluating radiation harden performance of electronic system based on system status[J]. High Power Laser and Particle Beams, 2016, 28: 084001. doi: 10.11884/HPLPB201628.150695
Citation:
Han Feng, Liu Yu, Wang Bin. Method for evaluating radiation harden performance of electronic system based on system status[J]. High Power Laser and Particle Beams, 2016, 28: 084001. doi: 10.11884/HPLPB201628.150695
Han Feng, Liu Yu, Wang Bin. Method for evaluating radiation harden performance of electronic system based on system status[J]. High Power Laser and Particle Beams, 2016, 28: 084001. doi: 10.11884/HPLPB201628.150695
Citation:
Han Feng, Liu Yu, Wang Bin. Method for evaluating radiation harden performance of electronic system based on system status[J]. High Power Laser and Particle Beams, 2016, 28: 084001. doi: 10.11884/HPLPB201628.150695
A method based on the simulation of system state is proposed to assess radiation hardened performance of electronic system. Based on radiation effects of devices of system, the system output is simulated using behavioral models which describe the electrical circuit behavior and its dependence on the radiation dose. By using Monte Carlo method, the uncertainty of system performance is calculated, then the margin and uncertainty of the system are determined. Applying the method to evaluate the radiation hardness performance of an A/D circuit illustrates the using steps of the method. The radiation experiment of the A/D circuit is performed to compare with the result given by the method.