Experimental research of heavy-ion single-event effect on Ethernet chip

A single-event experiment is carried out for the industrial Ethernet chip KSZ8851-16MLLJ by using a heavy ion source in order to evaluate and study the adaptability of the chip in the space environment. The single-event experimental plan is formulated according to the structure and function of the Ethernet chip to get experimental data which will be arranged and researched. Some results are shown about the experiment and research as follows. The chip has some anti-single-event radiation ability, the probability of single-event upset is different under different network transmission conditions, the chip will produce a current step in the continuous single-event radiation and the single event is locked when the second current step happens, and thus the radiation level of the chip is monitored by the current step in engineering application.