Suo Bin, Li Junya, Xu Xianguo, et al. Modeling and quantification of margin and uncertainty of gamma-dose radiation hardness of power supply circuit[J]. High Power Laser and Particle Beams, 2017, 29: 116003. doi: 10.11884/HPLPB201729.170139
Citation:
Suo Bin, Li Junya, Xu Xianguo, et al. Modeling and quantification of margin and uncertainty of gamma-dose radiation hardness of power supply circuit[J]. High Power Laser and Particle Beams, 2017, 29: 116003. doi: 10.11884/HPLPB201729.170139
Suo Bin, Li Junya, Xu Xianguo, et al. Modeling and quantification of margin and uncertainty of gamma-dose radiation hardness of power supply circuit[J]. High Power Laser and Particle Beams, 2017, 29: 116003. doi: 10.11884/HPLPB201729.170139
Citation:
Suo Bin, Li Junya, Xu Xianguo, et al. Modeling and quantification of margin and uncertainty of gamma-dose radiation hardness of power supply circuit[J]. High Power Laser and Particle Beams, 2017, 29: 116003. doi: 10.11884/HPLPB201729.170139
To assess the radiation hardness of the power supply circuit, the models of electronic components and circuit were built based on Saber platform, and were validated by the testing circuits. Data of critical performance parameters were obtained by -dose experiments radiation of pivotal components. With these data, radiation hardness of power supply circuit was simulated, and data about critical performance parameter were obtained. On these bases, gamma-dose radiation hardness of power supply circuit was evaluated by quantification of margins and uncertainties (QMU) method, and the results were in good agreement with those obtained experimentally.