Development of beam profile monitor using Kirkpatrick Baez mirrors

Zhu Dechong; Yue Junhui; Sui Yanfeng; Ji Daheng; Cao Jianshe; Ye Kairong; Chen Jie; Tian Shunqiang; Leng Yongbin

doi:10.11884/HPLPB201830.170415

Volume 30 Issue 4

Apr. 2018

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Zhu Dechong, Yue Junhui, Sui Yanfeng, et al. Development of beam profile monitor using Kirkpatrick Baez mirrors[J]. High Power Laser and Particle Beams, 2018, 30: 045102. doi: 10.11884/HPLPB201830.170415

Citation:

Zhu Dechong, Yue Junhui, Sui Yanfeng, et al. Development of beam profile monitor using Kirkpatrick Baez mirrors[J]. High Power Laser and Particle Beams, 2018, 30: 045102. doi: 10.11884/HPLPB201830.170415

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Development of beam profile monitor using Kirkpatrick Baez mirrors

doi: 10.11884/HPLPB201830.170415

1.
Key Laboratory of Particle Acceleration Physics and Technology, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
2.
University of Chinese Academy of Sciences, Beijing 100049, China
3.
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China

Received Date: 2017-10-29
Rev Recd Date: 2017-12-10
Publish Date: 2018-04-15

Abstract

Abstract

A Kirkpatrick Baez mirror imaging system has been designed and installed to measure the beam transverse profile and emittance of SSRF storage ring. The new system could be interchangeable with the original X-pinhole system. Two orthogonal cylindrical mirrors are used to image the dipole source point in the horizontal and vertical directions. Hard X-ray with peak energy of 20.5 keV will be focused at the X-ray scintillator camera. Aberration and point spread function which would cause image blur are evaluated. The system commissioning and optimization have been done. The electron transverse beam size has been measured precisely with horizontal 75.9 μm and vertical 20.2 μm. The system stability is less than 0.1 μm.
- KB mirror,
- beam size measurement,
- beam diagnostic,
- emittance,
- synchrotron radiation

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References(10)

References

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