Study on outgassing effect of electromagnetic radiation on aluminum film

Li Yao; Fan Jieqing; Zhang Fang; Tan Qun; Hao Jianhong; Dong Zhiwei; Zhao Qiang

doi:10.11884/HPLPB202133.210191

Volume 33 Issue 12

Dec. 2021

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Li Yao, Fan Jieqing, Zhang Fang, et al. Study on outgassing effect of electromagnetic radiation on aluminum film[J]. High Power Laser and Particle Beams, 2021, 33: 123008. doi: 10.11884/HPLPB202133.210191

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Li Yao, Fan Jieqing, Zhang Fang, et al. Study on outgassing effect of electromagnetic radiation on aluminum film[J]. High Power Laser and Particle Beams, 2021, 33: 123008. doi: 10.11884/HPLPB202133.210191

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Study on outgassing effect of electromagnetic radiation on aluminum film

doi: 10.11884/HPLPB202133.210191

1.
College of Electrical and Electronic Engineering, North China Electrical Power University, Beijing 102206, China
2.
Institute of Applied Physics and Computational Mathematics, Beijing 100094, China

Received Date: 2021-05-20
Rev Recd Date: 2021-10-20

Available Online: 2021-11-03

Publish Date: 2021-12-15

Abstract

Abstract

To study the electromagnetic radiation effect of the thermal control layer covering the surface of general spacecraft in the space environment, a model of electromagnetic wave irradiated metal aluminum film material was established. The PIC (Particle-in-Cell)-MCC (Monte Carlo collisions) method was adopted to numerically simulate the changes of positive ions and collision ionization electrons under different outgassing densities. The simulation results show that when the gas density on the surface of the aluminum film is small, avalanche ionization will not occur due to the low probability of outgassing collision ionization on the surface of the material. Only when the outgassing density exceeds the threshold, the outgassing collision ionization process on the material surface is strengthened, and avalanche ionization occurs on the surface of the material to generate plasma, which absorbs electromagnetic wave energy, and the total energy of its ions and electrons increases, which may cause damage to the metal aluminum film material.
- electromagnetic irradiation,
- PIC-MCC simulation,
- multipactor,
- outgassing,
- impact ionization

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References(15)

References

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