Volume 34 Issue 2
Jan.  2022
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Cui Zhitong, Chen Wei, Dong Yayun, et al. Circuit Simulation of GJB151B CS115 Part І: The analysis of calibration equipment indicators[J]. High Power Laser and Particle Beams, 2022, 34: 023002. doi: 10.11884/HPLPB202234.210406
Citation: Cui Zhitong, Chen Wei, Dong Yayun, et al. Circuit Simulation of GJB151B CS115 Part І: The analysis of calibration equipment indicators[J]. High Power Laser and Particle Beams, 2022, 34: 023002. doi: 10.11884/HPLPB202234.210406

Circuit Simulation of GJB151B CS115 Part І: The analysis of calibration equipment indicators

doi: 10.11884/HPLPB202234.210406
  • Received Date: 2021-09-10
  • Accepted Date: 2021-11-24
  • Rev Recd Date: 2021-11-25
  • Available Online: 2021-11-29
  • Publish Date: 2022-01-11
  • The composition and waveform of the calibration platform were defined in GJB151B CS115 for pulsed conducted sensitivity test, but the specific requirements for each device (pulse generator, current injection probe, calibration clamp, etc.) in the calibration platform are still not clear. To solve this problem, a time domain circuit model of the calibration platform was developed according the previous research on circuit simulation of pulsed current injection. By adjusting the parameters respectively, influences on the rise time and fall time of the calibration waveform caused by the inner inductance of the pulse generator and equivalent elements of the injection probe are simulated. Finally, the technical indicators for each device in the platform are obtained. This work is an essential supplement to GJB151B CS115 and is helpful to set up CS115 test platform for conducted immunity of electronic equipment test.
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