Electrical and thermal aging analysis of all-film pulsed capacitor

Huang Yunqi; Wang Lingyun; Zhang Dongdong; Chen Lin; Yuan Jianqiang; Xie Weiping; Deng Minghai; Kong Youjun

doi:10.11884/HPLPB202436.230163

Volume 36 Issue 2

Jan. 2024

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Article Navigation > High Power Laser and Particle Beams > 2024 > 36(2): 025020

Huang Yunqi, Wang Lingyun, Zhang Dongdong, et al. Electrical and thermal aging analysis of all-film pulsed capacitor[J]. High Power Laser and Particle Beams, 2024, 36: 025020. doi: 10.11884/HPLPB202436.230163

Citation:

Huang Yunqi, Wang Lingyun, Zhang Dongdong, et al. Electrical and thermal aging analysis of all-film pulsed capacitor[J]. High Power Laser and Particle Beams, 2024, 36: 025020. doi: 10.11884/HPLPB202436.230163

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Electrical and thermal aging analysis of all-film pulsed capacitor

doi: 10.11884/HPLPB202436.230163

1.
School of Electrical Engineering, Dalian University of Technology, Dalian 116024, China
2.
Institute of Fluid Physics, CAEP, Mianyang 621900, China
3.
Tianfu Innovation Energy Establishment, Chengdu 610000, China
4.
State Grid Guowang Integrated Energy Service Group, Ltd., Beijing 100052, China

Received Date: 2023-06-01
Accepted Date: 2023-12-06
Rev Recd Date: 2023-11-02

Available Online: 2023-12-09

Publish Date: 2024-01-12

Abstract

Abstract

The all-film pulsed capacitor is an important energy storage unit of the pulsed power system, and its lifetime affects the reliability of the whole system. Under the pulse condition, the failure of the all-film pulsed capacitor is mostly a sudden failure, and the life is highly dispersed. To explore the aging and failure mechanism of all-film pulsed capacitors, the life test and the simulation of electric and temperature fields were carried out. The life test of the capacitor was carried out by using the LTD basic discharge unit (brick) experimental chamber to test the life of the capacitor and obtain the failed capacitor, and the failure causes of the failed capacitor under different fault forms were analyzed, and the electric field simulation of the local “electric field distortion” area of the capacitor was carried out by using the finite element analysis software, which showed that the distorted electric field in the above area was the main reason for the breakdown of the insulating medium. The temperature field analysis of the capacitor shows that the temperature of the capacitor is positively correlated with the charge-discharge frequency, and the highest temperature point is located near the geometric center of the capacitor, and the temperature rise of the capacitor is not obvious when the charge-discharge frequency is low, indicating that the aging of the capacitor insulating medium is mainly electrical aging rather than thermal aging at low charge-discharge frequency.
- all-film pulsed capacitor,
- life test,
- aging,
- electric field distortion,
- failure mechanism

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References(19)

References

[1]	江伟华. 高重复频率脉冲功率技术及其应用: (5)脉冲叠加的意义[J]. 强激光与粒子束, 2013, 25(8):1877-1882 doi: 10.3788/HPLPB20132508.1877 Jiang Weihua. Repetition rate pulsed power technology and its applications: (V) The implication of pulse adding[J]. High Power Laser and Particle Beams, 2013, 25(8): 1877-1882 doi: 10.3788/HPLPB20132508.1877
[2]	陈林, 王勐, 谢卫平, 等. Z箍缩直线变压器驱动源原型模块设计[J]. 强激光与粒子束, 2014, 26:095007 doi: 10.3788/HPLPB20142609.95007 Chen Lin, Wang Meng, Xie Weiping, et al. Design of the linear transformer driver stage prototype for Z-pinch driver[J]. High Power Laser and Particle Beams, 2014, 26: 095007 doi: 10.3788/HPLPB20142609.95007
[3]	Li Hua, Li Liwei, Wang Wenjuan, et al. Study on the lifetime characteristics of pulsed capacitors based on the theory of space charge[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2016, 23(5): 2526-2533. doi: 10.1109/TDEI.2016.7736809
[4]	Li Jingtao, Zhao Zheng, Li Jianhao, et al. Experimental study on the lifetime of the all-film pulse capacitor in LTD systems[C]//2017 1st International Conference on Electrical Materials and Power Equipment (ICEMPE). 2017: 262-265.
[5]	张晨萌, 蓝天, 蓝磊, 等. 简化冲击电容器元件圆弧区缺陷场强三维有限元仿真[J]. 武汉大学学报(工学版), 2021, 54(5):421-428 Zhang Chenmeng, Lan Tian, Lan Lei, et al. Simplified three-dimensional finite element simulation of defect field intensity in the arc area of surge capacitor element[J]. Engineering Journal of Wuhan University, 2021, 54(5): 421-428
[6]	赵凯林. 电力电容器中油膜绝缘电老化与热老化的介电响应特性研究[D]. 重庆: 重庆大学, 2021 Zhao Kailin. The study on dielectric response characteristics of oil-film insulation in power capacitor after electrical and thermal aging[D]. Chongqing: Chongqing University, 2021
[7]	Feng Bingyang, Li Yuansheng, He Mengbing. Thermal characteristics of all-film pulsed capacitors in application of repetitive pulse discharge[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2021, 28(4): 1408-1415. doi: 10.1109/TDEI.2021.009567
[8]	国江, 马跃, 朱庆东, 等. 高压全膜电容器内熔丝温度场仿真分析[J]. 电力电容器与无功补偿, 2020, 41(5):74-80 Guo Jiang, Ma Yue, Zhu Qingdong, et al. Thermal field simulation analysis of internal fuse in high voltage film capacitors[J]. Power Capacitor & Reactive Power Compensation, 2020, 41(5): 74-80
[9]	王霞, 孙晓彤, 刘全宇, 等. 基于空间电荷效应的绝缘老化寿命模型的研究进展[J]. 高电压技术, 2016, 42(3):861-867 Wang Xia, Sun Xiaotong, Liu Quanyu, et al. Research development of aging models of insulation materials based on space charge effect[J]. High Voltage Engineering, 2016, 42(3): 861-867
[10]	李化, 吕霏, 林福昌, 等. 应用于脉冲功率系统的高储能密度电容器[J]. 强激光与粒子束, 2012, 24(3):554-558 doi: 10.3788/HPLPB20122403.0554 Li Hua, Lv Fei, Lin Fuchang, et al. High energy storage density capacitors in pulsed power application[J]. High Power Laser and Particle Beams, 2012, 24(3): 554-558 doi: 10.3788/HPLPB20122403.0554
[11]	Jiang Jinbo, He Mengbing. Design of low inductance, long life capacitor for linear transformer drivers[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2015, 22(6): 3555-3559. doi: 10.1109/TDEI.2015.004737
[12]	Mi Yan, Chen Yong, Liu Canhui, et al. Partial discharge characteristics of biaxially oriented polypropylene film under nanosecond pulse voltage with high rise rate[J]. IEEE Transactions on Plasma Science, 2023, 51(2): 498-506. doi: 10.1109/TPS.2023.3234033
[13]	方田, 李化, 黄想, 等. 工频叠加谐波电压下温度对全膜电容器绝缘介质击穿特性的影响[J]. 高压电器, 2022, 58(9):142-148 Fang Tian, Li Hua, Huang Xiang, et al. Influence of temperature on the dielectric breakdown characteristics of foil-film capacitor under AC superimposed harmonic voltage[J]. High Voltage Apparatus, 2022, 58(9): 142-148
[14]	闫澜锋, 刘刚, 刘锦宁. 有限元法分析金属杂质对电力电容器元件内部电场的影响[J]. 高压电器, 2012, 48(8):118-122 Yan Lanfeng, Liu Gang, Liu Jinning. Analyzing influences of metal impurities on internal electric field of power capacitors with finite element method[J]. High Voltage Apparatus, 2012, 48(8): 118-122
[15]	Li Hua, Li Zhiwei, Xu Zhijian, et al. Electric field and temperature dependence of electrical conductivity in biaxially oriented polypropylene films[J]. IEEE Transactions on Plasma Science, 2014, 42(11): 3585-3591. doi: 10.1109/TPS.2014.2360893
[16]	Qin S, Ho J, Rabuffi M, et al. Implications of the anisotropic thermal conductivity of capacitor windings[J]. IEEE Electrical Insulation Magazine, 2011, 27(1): 7-13. doi: 10.1109/MEI.2011.5699442
[17]	徐志坚, 李智威, 李化, 等. 重复频率脉冲电容器寿命测试平台[J]. 强激光与粒子束, 2014, 26:045023 doi: 10.3788/HPLPB20142604.45023 Xu Zhijian, Li Zhiwei, Li Hua, et al. Lifetime test platform for repetitive pulse capacitors[J]. High Power Laser and Particle Beams, 2014, 26: 045023 doi: 10.3788/HPLPB20142604.45023
[18]	MacDonald J R, Schneider M A, Schalnat M C, et al. Thermal modeling of high temperature power conversion capacitors[C]//2012 IEEE International Power Modulator and High Voltage Conference (IPMHVC). 2012: 256-259.
[19]	周晨, 张翔, 刘磊, 等. 换流阀阻尼电容器等效温升试验及寿命评估[J]. 电力工程技术, 2022, 41(5):149-155 Zhou Chen, Zhang Xiang, Liu Lei, et al. Equivalent temperature rise test and life evaluation of converter valve damping capacitor[J]. Electric Power Engineering Technology, 2022, 41(5): 149-155