Yang Jie, Shu Ting, Zhang Jun, et al. Optical diagnosis system for intense electron beam diode plasma[J]. High Power Laser and Particle Beams, 2012, 24: 963-967. doi: 10.3788/HPLPB20122404.0963
Citation:
Yang Jie, Shu Ting, Zhang Jun, et al. Optical diagnosis system for intense electron beam diode plasma[J]. High Power Laser and Particle Beams, 2012, 24: 963-967. doi: 10.3788/HPLPB20122404.0963
Yang Jie, Shu Ting, Zhang Jun, et al. Optical diagnosis system for intense electron beam diode plasma[J]. High Power Laser and Particle Beams, 2012, 24: 963-967. doi: 10.3788/HPLPB20122404.0963
Citation:
Yang Jie, Shu Ting, Zhang Jun, et al. Optical diagnosis system for intense electron beam diode plasma[J]. High Power Laser and Particle Beams, 2012, 24: 963-967. doi: 10.3788/HPLPB20122404.0963
A nanosecond time-resolved imaging platform for diode plasmas diagnostics has been constructed based on the pulsed electron beam accelerator and high speed framing camera(HSFC). The accelerator can provide an electrical pulse with voltages of 200-500 kV, rise-time (from 10% to 90% amplitude) of 25 ns and duration of 110 ns. The diode currents up to kA level can be extracted. The trigger signal for camera was picked up by a water-resistor voltage divider after the main switch of the accelerator, which could avoid the disadvantageous influence of the time jitter caused by the breakdown of the gas gaps. Then the sampled negative electrical pulse was converted into a transistor-transistor logic(TTL) signal (5 V) with rise time of about 1.5 ns and time jitter less than 1 ns via a processor. And this signal was taken as the synchronization time base. According to the working characteristics of the camera, the synchronization scheme relying mainly on electrical pulse delay method supplemented by light signal delay method was determined to make sure that the camera can work synchronously with the light production and transportation from the diode plasmas within the time scale of nanosecond. Moreover, shielding and filtering methods were used to restrain the interference on the measurement system from the accelerator. Finally, time resolved 2-D framing images of the diode plasmas were acquired.