Volume 24 Issue 11
Nov.  2012
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Chen Shangbi, Sheng Bin, Qiu Keqiang, et al. Cleaning method for improving laser induced damage threshold of multilayer dielectric pulse compressor gratings[J]. High Power Laser and Particle Beams, 2012, 24: 2631-2636. doi: 10.3788/HPLPB20122411.2631
Citation: Chen Shangbi, Sheng Bin, Qiu Keqiang, et al. Cleaning method for improving laser induced damage threshold of multilayer dielectric pulse compressor gratings[J]. High Power Laser and Particle Beams, 2012, 24: 2631-2636. doi: 10.3788/HPLPB20122411.2631

Cleaning method for improving laser induced damage threshold of multilayer dielectric pulse compressor gratings

doi: 10.3788/HPLPB20122411.2631
  • Received Date: 2012-03-06
  • Rev Recd Date: 2012-05-03
  • Publish Date: 2012-11-01
  • Oxygen plasma and HPM solution (mixtures of hydrochloric acid, hydrogen peroxide, and deionized water) were applied to cleaning the multilayer dielectric (MLD) pulse compressor gratings. X-ray photoelectron spectroscopy was carried out to evaluate surface cleanliness of the gratings. It is found that photoresist and fluorocarbon residues can be efficiently removed with oxygen-plasma cleaning and metal contaminants can be completely removed with HPM cleaning. After cleaning processes, the typical diffraction efficiencies in -1st reflected order are maintained larger than 95.0% at an incidence of 66.4 in TE polarization, and the laser induced damage threshold (LIDT) for 10-ps laser pulse at 1053 nm is greatly improved to 1.6 J/cm2. The cleaning method using oxygen plasma and HPM solution can efficiently make the surface clean and therefore enhance the LIDT of MLD gratings.
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