Volume 25 Issue 02
Dec.  2012
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Zhao Lingling, Sun Delin, Hu Jiasheng. KBA X-ray microscopy system[J]. High Power Laser and Particle Beams, 2013, 25: 371-374. doi: 10.3788/HPLPB20132502.0371
Citation: Zhao Lingling, Sun Delin, Hu Jiasheng. KBA X-ray microscopy system[J]. High Power Laser and Particle Beams, 2013, 25: 371-374. doi: 10.3788/HPLPB20132502.0371

KBA X-ray microscopy system

doi: 10.3788/HPLPB20132502.0371
  • Received Date: 2012-02-02
  • Rev Recd Date: 2012-07-02
  • Publish Date: 2013-02-10
  • The object and the image of the KBA X-ray microscope are not in the same horizontal plane. To overcome the difficulty of installing the KBA X-ray microscope in the target chamber,a double-aiming mode is adopted. Unlike general optical systems, the angle of the KBA X-ray microscope between the pseudo-axis and the real axis is 8.748 6,thus an observing system is designed to satisfy the demand of the grazing incident angle. As the object angle is small, the focus depth is too big if the visual light is used to install the microscope, so an auxiliary optical system is designed, and the focus depth is within 5 mm.
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