liu qiang, lin li bin, gan rong bing, et al. Investigation on zero probability damage threshold of highreflective thin films[J]. High Power Laser and Particle Beams, 2003, 15.
Citation:
liu qiang, lin li bin, gan rong bing, et al. Investigation on zero probability damage threshold of highreflective thin films[J]. High Power Laser and Particle Beams, 2003, 15.
liu qiang, lin li bin, gan rong bing, et al. Investigation on zero probability damage threshold of highreflective thin films[J]. High Power Laser and Particle Beams, 2003, 15.
Citation:
liu qiang, lin li bin, gan rong bing, et al. Investigation on zero probability damage threshold of highreflective thin films[J]. High Power Laser and Particle Beams, 2003, 15.
In process of the arranging experiment data for determining the damage threshold, it is found in some samples that the distribution of the data points of the experiment results deviates obviously from the linear distribution. Under this situation, as the damage threshold is determined from the linear extrapolation of the measured energydensity dependent damage probability based on the ISO11254, another damage threshold of zero probability is obtained by the different nonlinear fit of the experiment data. After making a comparison between these two values and contrasting them with the experiment results, it is obtained from some samples that the damage threshold of zero probability extrapolated by the nonlinear fit is more close to the “real” damage threshold.
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