Volume 19 Issue 10
Oct.  2007
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yang jia-min, zhang ji-yan, wu ze-qing, et al. Quasi-quantitative experimental measurement of K-shell X-ray line spectrum from thin aluminum-dot target[J]. High Power Laser and Particle Beams, 2007, 19.
Citation: yang jia-min, zhang ji-yan, wu ze-qing, et al. Quasi-quantitative experimental measurement of K-shell X-ray line spectrum from thin aluminum-dot target[J]. High Power Laser and Particle Beams, 2007, 19.

Quasi-quantitative experimental measurement of K-shell X-ray line spectrum from thin aluminum-dot target

  • Publish Date: 2007-10-15
  • A thin aluminum-dot target was presented to avoid gradients in temperature and density and self-absorption of the lines. The target is a film consisting of 20 mm thick CH substrate and 0.1 mm thick aluminum dot with diameter of 200 mm covered by 0.1 mm thick CH on the dot surface. The quasi-quantitative X-ray spectrum has been derived from the film recording signal by correcting the film response, filter absorption and the diagnostic geometry of the spectrometer and neglecting X-ray wavelength dependence of the crystal diffraction efficiency due to relatively small wavelength range. A non-local thermodynamic equilibrium spectral code was applied to simulate the measured aluminum spectrum. Good agreement between the measurement and the simulation was obtained through direct comparison and n
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