Volume 20 Issue 08
Aug.  2008
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zhang yin-hua, huang wei, zhang yun-dong. Mechanical properties of YbF3 thin film deposited by thermal evaporation[J]. High Power Laser and Particle Beams, 2008, 20.
Citation: zhang yin-hua, huang wei, zhang yun-dong. Mechanical properties of YbF3 thin film deposited by thermal evaporation[J]. High Power Laser and Particle Beams, 2008, 20.

Mechanical properties of YbF3 thin film deposited by thermal evaporation

  • Publish Date: 2008-08-15
  • The stress and adhesion of YbF3 thin film deposited by thermal evaporation have been investigated. The stresses of singlelayer YbF3 thin films at different technical conditions have been evaluated by using a Veeco interferometer. In our experiment, residual stress of YbF3 thin film is tensile. Thermal stress seems to be the main contribution to the residual stress. Deposition method affects the stress of thin film. The stress relaxation is observed in air. The stress of YbF3 thin film increases after heat treatment.
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      沈阳化工大学材料科学与工程学院 沈阳 110142

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