Volume 16 Issue 05
May  2004
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xie jun, wu wei-dong, ye cheng-gang, et al. Vacuum diffusion bonding technology of aluminum/copper films[J]. High Power Laser and Particle Beams, 2004, 16.
Citation: xie jun, wu wei-dong, ye cheng-gang, et al. Vacuum diffusion bonding technology of aluminum/copper films[J]. High Power Laser and Particle Beams, 2004, 16.

Vacuum diffusion bonding technology of aluminum/copper films

  • Publish Date: 2004-05-15
  • According to the requirement of the ICF experiments, the vacuum diffusion bonding of the aluminum and copper films were studied in high temperature circumstances(250℃). The microstructures of the joint and surface roughness are analyzed by means of SEM, XRD and an alpha-step device. The results show that the force among atoms, metallurgy combination and interface reaction are important to obtain the high quality joint of the aluminum and copper films.
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