chen meng, xiang xia, jiang yong, et al. Enhancement of laser induced damage threshold of fused silica by acid etching combined with UV laser conditioning[J]. High Power Laser and Particle Beams, 2010, 22.
Citation:
chen meng, xiang xia, jiang yong, et al. Enhancement of laser induced damage threshold of fused silica by acid etching combined with UV laser conditioning[J]. High Power Laser and Particle Beams, 2010, 22.
chen meng, xiang xia, jiang yong, et al. Enhancement of laser induced damage threshold of fused silica by acid etching combined with UV laser conditioning[J]. High Power Laser and Particle Beams, 2010, 22.
Citation:
chen meng, xiang xia, jiang yong, et al. Enhancement of laser induced damage threshold of fused silica by acid etching combined with UV laser conditioning[J]. High Power Laser and Particle Beams, 2010, 22.
Acid etching combined with UV laser conditioning is developed to enhance the laser induced damage threshold (LIDT) of fused silica. Firstly, the fused silica is etched for 1~100 min with a buffered 1% HF solution. After acid etching, its transmittance, surface roughness and LIDT are measured. The results reveal that the fused silica has the highest LIDT and transmittance after etching for 10 min. Then UV laser (355 nm) conditioning is adopted to process the 10-min-etched fused silica. When the laser fluence is below 60% of fused silica’s zero probability damage threshold, the LIDT increases gradually with the increase of laser conditioning fluence. However, the LIDT rapidly decreases to be lower than the threshold of the 10-min-etched fused silica when the conditioning fluence is up to 80