yan ji, jiang shao, lin zhiwei, et al. Experimental research on pinhole-assisted point-projection backlighting on Shenguang-Ⅱ laser facility[J]. High Power Laser and Particle Beams, 2011, 23.
Citation:
yan ji, jiang shao, lin zhiwei, et al. Experimental research on pinhole-assisted point-projection backlighting on Shenguang-Ⅱ laser facility[J]. High Power Laser and Particle Beams, 2011, 23.
yan ji, jiang shao, lin zhiwei, et al. Experimental research on pinhole-assisted point-projection backlighting on Shenguang-Ⅱ laser facility[J]. High Power Laser and Particle Beams, 2011, 23.
Citation:
yan ji, jiang shao, lin zhiwei, et al. Experimental research on pinhole-assisted point-projection backlighting on Shenguang-Ⅱ laser facility[J]. High Power Laser and Particle Beams, 2011, 23.
The research on pinhole-assisted point-projection backlighting has been performed on Shanghai Shenguang-Ⅱ laser facility. The point-like X-ray source at 4.75 keV was produced from 200 J/200 ps/351 nm backlighting laser interaction with 10 μm thick Ti target. And the clear gridding image with a spatial resolution of 7 μm was obtained. Key issues in improving signal-to-noise ratio and preventing blasting debris were analyzed. The pinhole-assisted point-projection backlighting shows advantages over traditional backlighting techniques, such as high spatial resolution, large view field.