zhang rong-zhu, yang chun-lin, xu qiao, et al. Ａnti-tilting technology of the sub-aperture stitching interferograms[J]. High Power Laser and Particle Beams, 2004, 16.
Citation:
zhang rong-zhu, yang chun-lin, xu qiao, et al. Ａnti-tilting technology of the sub-aperture stitching interferograms[J]. High Power Laser and Particle Beams, 2004, 16.
zhang rong-zhu, yang chun-lin, xu qiao, et al. Ａnti-tilting technology of the sub-aperture stitching interferograms[J]. High Power Laser and Particle Beams, 2004, 16.
Citation:
zhang rong-zhu, yang chun-lin, xu qiao, et al. Ａnti-tilting technology of the sub-aperture stitching interferograms[J]. High Power Laser and Particle Beams, 2004, 16.
In the test process of the large aperture components the influence of the tilting of the components is very serious. Specially, in the sub-aperture stitching process the tilting of the components may cause the missing of the data. This paper introduces the anti-tilting technology, which tilts the interferogram on the opposite direction of the components' tilting. To avoid the difficulty of manual operation, the computer optimization method has been employed. Experiments have been done to verify the feasibility and the validity of this technique. After the anti-titling the right stitching result can be gotten and it is possible to compare different test results with one test system. And the mean of the residual errors of the compare is only ０．１２λ (λ equals to 633nm).
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