han feng, wang jian-guo, jiao li-cheng, et al. Applications of fuzzy neural network to susceptibility assessments of electronic devices illuminated or injected by microwaves[J]. High Power Laser and Particle Beams, 2004, 16.
Citation:
han feng, wang jian-guo, jiao li-cheng, et al. Applications of fuzzy neural network to susceptibility assessments of electronic devices illuminated or injected by microwaves[J]. High Power Laser and Particle Beams, 2004, 16.
han feng, wang jian-guo, jiao li-cheng, et al. Applications of fuzzy neural network to susceptibility assessments of electronic devices illuminated or injected by microwaves[J]. High Power Laser and Particle Beams, 2004, 16.
Citation:
han feng, wang jian-guo, jiao li-cheng, et al. Applications of fuzzy neural network to susceptibility assessments of electronic devices illuminated or injected by microwaves[J]. High Power Laser and Particle Beams, 2004, 16.
In this paper, the fuzzy neural network is applied to evaluate the failure thresholds of electronic devices as a function of the parameters of the high power microwave. Based on the characteristic of experimental data, this paper presents a method to evaluate the possibility distribution of electronic device failure applying the possibility theory. Combining the possibility theory and prediction ability of the fuzzy neural network ,the possibility distribution of electronic device failure can be obtained.