Volume 16 Issue 07
Jul.  2004
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han feng, wang jian-guo, jiao li-cheng, et al. Applications of fuzzy neural network to susceptibility assessments of electronic devices illuminated or injected by microwaves[J]. High Power Laser and Particle Beams, 2004, 16.
Citation: han feng, wang jian-guo, jiao li-cheng, et al. Applications of fuzzy neural network to susceptibility assessments of electronic devices illuminated or injected by microwaves[J]. High Power Laser and Particle Beams, 2004, 16.

Applications of fuzzy neural network to susceptibility assessments of electronic devices illuminated or injected by microwaves

  • Publish Date: 2004-07-15
  • In this paper, the fuzzy neural network is applied to evaluate the failure thresholds of electronic devices as a function of the parameters of the high power microwave. Based on the characteristic of experimental data, this paper presents a method to evaluate the possibility distribution of electronic device failure applying the possibility theory. Combining the possibility theory and prediction ability of the fuzzy neural network ,the possibility distribution of electronic device failure can be obtained.
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      沈阳化工大学材料科学与工程学院 沈阳 110142

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