He Tie, Lei Jiarong, Liu Meng, et al. Fen+ beam profile diagnostics based on Al2O3:Cr scintillating screen[J]. High Power Laser and Particle Beams, 2013, 25: 1013-1016.
Citation:
He Tie, Lei Jiarong, Liu Meng, et al. Fen+ beam profile diagnostics based on Al2O3:Cr scintillating screen[J]. High Power Laser and Particle Beams, 2013, 25: 1013-1016.
He Tie, Lei Jiarong, Liu Meng, et al. Fen+ beam profile diagnostics based on Al2O3:Cr scintillating screen[J]. High Power Laser and Particle Beams, 2013, 25: 1013-1016.
Citation:
He Tie, Lei Jiarong, Liu Meng, et al. Fen+ beam profile diagnostics based on Al2O3:Cr scintillating screen[J]. High Power Laser and Particle Beams, 2013, 25: 1013-1016.
Some techniques of beam profile measurements such as wire rotating scan, Faraday cups array and infrared imagingwere investigated. A measurement device was built based on scintillating screen to cater for the demand of accelerator beam profile diagnostics. The device was bombarded under several tens to hundred nanoampere Fen+(n~512) ion beam. The Fen+ ion beam experiment shows that the imaging saturation is mainly caused by light intensity rather than scintillating screen. A way to solve the saturation problem with a specially developed lens was mentioned. The grayscale of beam profile imaging is approximately linear with respect to the beam intensity, and the reason for formation of this relationship was analyzed.