激光锗等离子体电子密度诊断
DIAGNOSTICS OF ELECTRON DENSITY IN LASER-PRODUCED Ge PLASMA
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摘要: 本工作测量了激光加热锗等离子体XUV光谱,对所测得的Ge ⅩⅫ谱线进行了辨认和分类。通过对各谱线的考察,找出了对电严密度敏感,对电子温度不敏感,波长在20nm左右的类钠离子3p—3d及3s—3p跃迁线,收集和计算了所需参数,给出谱线强度比随电子密度变化曲线,根据谱线强度比推导了锗等离子体的电子密度,并与理论计算结果进行了比较,二者符合较好。Abstract: XUV spectra from GeXX Ⅱ in laser-produced plasmas are identified. The intensities of the transtions from 3p2P3/2-3d2D5/2 and 3s2S1/2 -3p2P3/2 are sensitive to electron densities between 1019 and 1021/cm3 and not sensitive to the electron temperature. Calculations of the intensity ratio vs the electron density are performed. Electron densities in laser-produced Ge plasmas have been deduced from the ratio.
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Key words:
- plasma diagnostic /
- X-ray laser /
- XUV spectra /
- laser-produced plasma
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