超紫外波段的X射线底片相对标定
IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGE
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摘要: 介绍X射线底片在超紫外波段(19.0～22.0nm)的相对标定方法。在LF-11激光装置上,用激光产生等离子体作为标定源,同时控制显影条件和底片类型与测X光激光时相同,标定出美国Kodak公司生产的SWR型底片特性曲线。解决了底片响应对所测X光激光增益系数的影响。结果表明,在超紫外波段,波长对特性曲线影响可不考虑。Abstract: A method of a relative calibration of SWR film used for mearuring intensity of X rays from laser produced plasma was reported in this paper. Using X rays from the plasma as a source of calibration, we have measured characteristics of Kodak SWR film produced by U.S.A. The result was used to modify the gain coefficiet of X-ray laser measured in our laboratory.
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Key words:
- characteristic curve /
- film
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