软X射线测量用电阻式薄膜量热计

A resistive bolometer for measuring soft X-ray radiation energy

摘要: 介绍了一种用于软X射线辐射能量测量的电阻式薄膜量热计。利用电流的欧姆热效应对薄膜量热计的灵敏度进行了标定。在有基底薄膜的标定过程中,采用一维热扩散模型,考虑了金属薄膜向基底的传导热损失。利用电阻式薄膜量热计对聚龙一号装置钨丝阵Z箍缩产生的软X射线进行了测量,并与平响应X射线二极管(XRD)探测器的测量结果进行了比较。实验结果表明,电阻式薄膜量热计测量的软X射线辐射能量和辐射功率与平响应XRD探测器结果在测量不确定度范围内合理地一致。

Abstract: A resistive bolometer which is used to diagnose soft X-ray fluence is described. The bolometer is calibrated with Ohm heating. In the calibration scheme, heat loss into the substrate is considered with a simple one-dimensional heat conduction model. We utilize the bolometer to diagnose soft X-ray fluence of tungsten wire array Z-pinch experiments on PTS. Comparison of the bolometer measurements with a flat spectral response XRD (FSR-XRD) shows that the soft X-ray power and energy measurements from bolometers are reasonably consistent with that obtained by FSR-XRD.