Abstract: The resistive bolometer is an accurate, robust, spectrally broadband technique for measuring total soft X-ray yield. By replacing the pulsed voltage driver with a pulsed current driver and removing the series-wound resistance, the change of resistance between the ends of Ni-film can be measured directly, thus the measurement precision can be promoted effectively. The applicability of this improved resistive bolometer is expanded to all typical Z-pinch loads on Qiangguang-Ⅰ facility. Data analysis shows that the uncertainty decreases from 49.0% to 19.6% in measuring X-ray yield generated by Al wire array Z-pinches. X-ray yield data from the resistive bolometer were compared with the ones from the X-ray power measure system. The ratios between them were between 0.87 and 1.04.