用表面热透镜技术测量1315nm高反射硅镜弱吸收的研究
The study of weak absorption of the high reflection thin films coated on the Si plates at 1315nm by the STL
-
Abstract: Using surface thermal lensing method to measure weak absorption of the thin films coated on the Si plates at 1315nm, we have concluded the reason that induced absorption, and can give a measuring guarantee to reduce their absorption and loss in the process of coating thin films．
-
Key words:
- surface thermal lensing /
- weak absorption
-
点击查看大图
计量
- 文章访问数: 2238
- HTML全文浏览量: 212
- PDF下载量: 734
- 被引次数: 0
下载:
