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摘要:
针对皮秒脉冲激光产生的X射线能谱精密诊断需求，提出了一种晶体谱仪，该谱仪使用曲率为200 mm的透射式石英弯晶作为色散元件，测谱范围可覆盖8～60 keV。使用该谱仪在星光III和神光II升级装置进行了应用，成功获得了铜、钼、银等元素的特征线能谱，以及金的L壳层特征线，测量获得的能谱信噪比较高，显示了谱仪在测量皮秒激光产生的X射线能谱上的良好性能。
Abstract:In this paper, a transmission curved crystal spectrometer is developed . The transmission curved crystal spectrometer employs a quartz crystal with radius of 200 mm covering the measuring range of 8 keV to 60 keV. We have applied the spectrometer to measure X-ray sources driven by picosecond laser both at XG-III and the SGII-Updated laser facility. The characteristic Kα and Kβ line emissions from Cu, Mo, Ag, and Zr were measured. Specifically, the L-shell emissions from Au targets irradiated by the picosecond lasers with different pulse duration were compared. The spectra show good signal-to-noise ratio, which indicates the spectrometer is suitable for the diagnostic of picosecond laser produced X-ray sources.
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Figure 5. Obtained L-shell emission spectroscopy of Au using the transmission curved crystal spectrometers
Table 1. Energies of the observed line emissions
target material lines theoretical energy/keV measured energy/keV Cu Kα1 8.0478 8.048 Kβ1 8.9053 — He-like 2p3P1 8.3470 8.332 He-like 2p1P1 8.3920 8.375 H-like 2p1/2 8.6660 8.667 H-like 2p3/2 8.6990 9.716 9.822 Mo Kα1 17.4793 17.480 Kα2 17.3743 Kβ1 19.6083 19.680 Ag Kα1 22.1629 22.170 Kα2 21.9903 22.010 Kβ1 24.9424 24.950 Zr Kα1 15.7751 15.770 Kα2 15.6909 15.690 Kβ1 17.6678 17.630 
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