YanYoujie, Jiang Tingyong, Liu Xiaolong, et al. Traceability and uncertainty of ultra-wide band short pulse electric-field standard device[J]. High Power Laser and Particle Beams, 2014, 26: 063022. doi: 10.11884/HPLPB201426.063022
Citation:
YanYoujie, Jiang Tingyong, Liu Xiaolong, et al. Traceability and uncertainty of ultra-wide band short pulse electric-field standard device[J]. High Power Laser and Particle Beams, 2014, 26: 063022. doi: 10.11884/HPLPB201426.063022
YanYoujie, Jiang Tingyong, Liu Xiaolong, et al. Traceability and uncertainty of ultra-wide band short pulse electric-field standard device[J]. High Power Laser and Particle Beams, 2014, 26: 063022. doi: 10.11884/HPLPB201426.063022
Citation:
YanYoujie, Jiang Tingyong, Liu Xiaolong, et al. Traceability and uncertainty of ultra-wide band short pulse electric-field standard device[J]. High Power Laser and Particle Beams, 2014, 26: 063022. doi: 10.11884/HPLPB201426.063022
The traceability and uncertainty of ultra-wideband short pulse(UWB-SP) electric-field standard device was researched in this paper. There is no UWB-SP E-field national primary standard, we got the traceability of E-field from pulse parameters, S parameters and dimension parameters national primary standard. The mathematic model of the E-field was established. We evaluated the uncertainty of the source output, the uncertainty of transmission and the uncertainty of structure dimensions, than we calculated the combined standard uncertainty. Finally, the expanded uncertainty of the E-field produced by the standard device was 8.4%.