Reliability of large LTD device analysis

Ji Ce; Zhou Liangji; Jiao Jian; Ren Fuchun; Chen Lin; Jiang Jihao; Zhao Yue

doi:10.11884/HPLPB201830.170341

Volume 30 Issue 4

Apr. 2018

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Article Navigation > High Power Laser and Particle Beams > 2018 > 30(4): 045003

Ji Ce, Zhou Liangji, Jiao Jian, et al. Reliability of large LTD device analysis[J]. High Power Laser and Particle Beams, 2018, 30: 045003. doi: 10.11884/HPLPB201830.170341

Citation:

Ji Ce, Zhou Liangji, Jiao Jian, et al. Reliability of large LTD device analysis[J]. High Power Laser and Particle Beams, 2018, 30: 045003. doi: 10.11884/HPLPB201830.170341

Ji Ce, Zhou Liangji, Jiao Jian, et al. Reliability of large LTD device analysis[J]. High Power Laser and Particle Beams, 2018, 30: 045003. doi: 10.11884/HPLPB201830.170341

Citation:

Ji Ce, Zhou Liangji, Jiao Jian, et al. Reliability of large LTD device analysis[J]. High Power Laser and Particle Beams, 2018, 30: 045003. doi: 10.11884/HPLPB201830.170341

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Reliability of large LTD device analysis

doi: 10.11884/HPLPB201830.170341

Ji Ce^{1, 2, 3
,},
Zhou Liangji^{2, 3
,
,},
Jiao Jian⁴,
Ren Fuchun⁴,
Chen Lin^{2, 3},
Jiang Jihao^{2, 3},
Zhao Yue^{2, 3}

1.
Institute of Fluid Physics, CAEP, P.O.Box 919-108, Mianyang 621999, China
2.
Graduate School of China Academy of Engineering Physics, Beijing 100088, China
3.
Key Laboratory of Pulsed Power Technology, CAEP, Mianyang 621999, China
4.
School of Reliability and Systems Engineering, Beihang University, Beijing 100083, China

Received Date: 2017-08-31
Rev Recd Date: 2017-12-11
Publish Date: 2018-04-15

Abstract

Abstract

A large LTD device capable of delivering about 50 MA pulsed current to load consists of hundreds of thousands of capacitors, switches and trigger units. To achieve high reliability of such an enormous system is quite difficult with the series system reliability model, the required reliability of each switch is almost impossible to realize. The main fault modes of LTD device are switch prefire and trigger unit fault. The switch prefire will result in the failure of the LTD cavity where the prefire occurs. The fault of trigger unit would affect more LTD cavities because one trigger unit triggers several LTD cavities. The key to achieve high reliability level and meet the required performance, it is key that some fault LTD cavities are allowed and the number of fault LTD cavities is limited in different place. In this paper a reliability model of the LTD system is built from a conceptual design of the LTD device. The number of the fault LTD cavities would be strictly limited in the system, module and layer in the reliability model. For a given system reliability, the reliability values of switch and trigger unit are calculated by Monte-Carlo method. The method of fault isolation is also analyzed.
- large LTD device,
- reliability model,
- main fault mode,
- Monte-Carlo method,
- fault isolation

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References(14)

References

[1]	Weinbrecht E A, Bloomquist D H, Mcdaniel D H, et al. Status of the Z refurbishment project (ZR) at Sandia National Laboratories[C]//Proceedings of 15th IEEE International Pulsed Power Conference. 2005: 170-173.
[2]	Dennis J A, Daniel B. ZR reliability and operations analysis[C]//Proceedings of 14th IEEE International Pulsed Power Conference. 2003: 183-186.
[3]	Bartsch R R. ATLAS reliability analysis[C]//Proceedings of 10th IEEE International Pulsed Power Conference. 1995: 417-422.
[4]	丰树平, 李洪涛, 曹文彬, 等. Z箍缩实验装置高电压低抖动Marx发生器[J]. 强激光与粒子束, 2009, 21(1): 152-156. http://www.hplpb.com.cn/article/id/3851 Feng Shuping, Li Hongtao, Cao Wenbin, et al. High voltage low jitter Marx generator of prototype module of primary test stand. High Power Laser and Particle Beams, 2009, 21(1): 152-156 http://www.hplpb.com.cn/article/id/3851
[5]	李洪涛, 王玉娟, 丰树平, 等. 4 MV激光触发多级多通道开关特性[J]. 强激光与粒子束, 2007, 19(11): 1923-1926. http://www.hplpb.com.cn/article/id/3393 Li Hongtao, Wang Yujuan, Feng Shuping, et al. Switching property of 4 MV laser-triggered multistage switch. High Power Laser and Particle Beams, 2007, 19(11): 1923-1926 http://www.hplpb.com.cn/article/id/3393
[6]	夏明鹤, 王勐, 王玉娟, 等. 4 MV同轴-三平板型水介质自击穿开关设计[J]. 强激光与粒子束, 2006, 18(3): 496-500. http://www.hplpb.com.cn/article/id/2532 Xia Minghe, Wang Meng, Wang Yujuan, et al. Design of 4 MV coaxial-triplate water pulse forming line switch. High Power Laser and Particle Beams. 2006, 18(3): 496-500 http://www.hplpb.com.cn/article/id/2532
[7]	计策, 丰树平, 夏明鹤, 等. "聚龙一号"装置同步性实验研究[J]. 强激光与粒子束, 2016, 28: 015021. doi: 10.11884/HPLPB201628.015021 Ji Ce, Feng Shuping, Xia Minghe, et al. PTS experimental study on synchronization. High Power Laser and Particle Beams, 2016, 28: 015021 doi: 10.11884/HPLPB201628.015021
[8]	曾声奎. 可靠性设计与分析[M]. 北京: 国防工业出版社. 2011: 66-71. Zeng Shenkui, Reliability design and analysis. Beijing: National Denfense Industry Press, 2011: 66-71
[9]	Kim A A, Kovalchuk B M, Bastrilov A N, et al. 100 ns current rise time LTD stage[C]//Proceedings of 13th IEEE International Pulsed Power Conference. 2001: 1491-1494.
[10]	Mazarakis M G, Fowler W E, Long F W, et al. High current fast LTD driver development in Sandia Laboratory[C]//Proceedings of 15th IEEE International Pulsed Power Conference. 2005: 390-393.
[11]	Leckbee J, Maenchen J, Johnson D L, et al. Design, simulation, and fault analysis of a 6.5-MV LTD for flash X-ray radiopraphy[J]. IEEE Trans Plasma Sci, 2006, 34(5): 1888-1899. doi: 10.1109/TPS.2006.879553
[12]	Stygar W A, Awe T J, Bailey J E, et al. Conceptual designs of two petawatt-class pulsed-power accelerators for high-energy-density-physics experiments[J]. Physical Review Special Topics-Accelerators and Beams, 2015, 18: 110401.
[13]	陈林, 蒋吉昊, 邹文康, 等. LTD串联装置中部分模块不工作时的输出性能[J]. 强激光与粒子束, 2016, 28: 045004. doi: 10.11884/HPLPB201628.125004 Chen Lin, Jiang Jihao, Zou Wenkang, et al. Performance of 10-stage LTD generator with some malfunctioning stages. High Power Laser and Particle Beams, 2016, 28: 045004 doi: 10.11884/HPLPB201628.125004
[14]	赵宇. 可靠性数据分析[M]. 北京: 国防工业出版社. 2011: 334-340. Zhao Yu, Data analysis of reliability. Beijing: National Denfense Industry Press, 2011: 334-340