Influence factors of the pulsed breakdown time delay jitter of a self-triggered UV-illuminated switch and an improvement method

Wang Tianchi; Wang Haiyang; Huang Tao; Li Junna; Wu Gang; Xie Linshen; Chen Wei; Du Yingchao

doi:10.11884/HPLPB202234.210459

Volume 34 Issue 7

May 2022

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Article Navigation > High Power Laser and Particle Beams > 2022 > 34(7): 075010

Wang Tianchi, Wang Haiyang, Huang Tao, et al. Influence factors of the pulsed breakdown time delay jitter of a self-triggered UV-illuminated switch and an improvement method[J]. High Power Laser and Particle Beams, 2022, 34: 075010. doi: 10.11884/HPLPB202234.210459

Citation:

Wang Tianchi, Wang Haiyang, Huang Tao, et al. Influence factors of the pulsed breakdown time delay jitter of a self-triggered UV-illuminated switch and an improvement method[J]. High Power Laser and Particle Beams, 2022, 34: 075010. doi: 10.11884/HPLPB202234.210459

Citation:

Wang Tianchi, Wang Haiyang, Huang Tao, et al. Influence factors of the pulsed breakdown time delay jitter of a self-triggered UV-illuminated switch and an improvement method[J]. High Power Laser and Particle Beams, 2022, 34: 075010. doi: 10.11884/HPLPB202234.210459

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Influence factors of the pulsed breakdown time delay jitter of a self-triggered UV-illuminated switch and an improvement method

doi: 10.11884/HPLPB202234.210459

1.
Key Laboratory of Particle & Radiation Imaging, Ministry of Education, Tsinghua University, Beijing 100084, China
2.
State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
3.
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China

Received Date: 2021-10-31
Accepted Date: 2022-01-14
Rev Recd Date: 2021-12-26

Available Online: 2022-07-04

Publish Date: 2022-05-12

Abstract

Abstract

Influence factors of the breakdown delay jitter of a self-triggered UV-illuminated switch are studied. It indicates that the switch electric field at the injection time of pre-ionization is the decisive factor of the time jitter when the capacitor discharge stage of the trigger gap works. Increasing the operating coefficient and using electrode material with lower working function cannot remarkably reduce the time jitter when the switch breaks down near the peak time. The improvement method is to reduce the value of parallel resistors, which can extend the duration of sufficient arcing of the trigger gap and eliminate the influence of pre-ionization injection time and its jitter. By adapting this method, the time jitter is less than 1.3 ns or 2.8 ns under a pulse rise time of 100 ns or 180 ns when the operating voltage is 300−800 kV.
- gas switch,
- pre-ionization,
- self-triggering,
- pulsed breakdown time delay,
- jitter

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References(11)

References

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