Xu Jie, Mu Baozhong, Chen Liang, et al. Progress of grazing incidence X-ray micro-imaging diagnosis technologyJ. High Power Laser and Particle Beams, 2020, 32(11): 112001. DOI: 10.11884/HPLPB202032.200133
Citation: Xu Jie, Mu Baozhong, Chen Liang, et al. Progress of grazing incidence X-ray micro-imaging diagnosis technologyJ. High Power Laser and Particle Beams, 2020, 32(11): 112001. DOI: 10.11884/HPLPB202032.200133

Progress of grazing incidence X-ray micro-imaging diagnosis technology

  • High-precision X-ray imaging diagnosis is the key to understanding the implosion process and revealing unknown physical problems at the ignition scale. X-ray microscope based on grazing incidence reflection, combined with sub-nanometer ultra-smooth spherical or aspherical mirror, can achieve high-resolution imaging with spatial resolution better than 5 μm. This paper introduces the development and application of foreign X-ray microscopic imaging technology in the field of ICF research, highlights the progress of China’s high-resolution X-ray Kirkpatrick-Baez (KB) microscope, multi-channel X-ray KB microscope and large-field X-ray KBA microscope. The research plan for the next stage of ultra-high resolution X-ray microscopic imaging is analyzed. Through continuous technological innovation, China's X-ray microscopic imaging diagnostic capabilities have reached the internationally advanced level.
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