Cavity ring-down method based performance characterization and defect analysis of large-aperture sampling optics

Zhou Wenchao; Ting Deng; Chen Peng; Yulong Cao; Wei Wei; Siliang Liu; Wang Jing

doi:10.11884/HPLPB202537.240413

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Zhou Wenchao, Ting Deng, Chen Peng, et al. Cavity ring-down method based performance characterization and defect analysis of large-aperture sampling optics[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202537.240413

Citation:

Zhou Wenchao, Ting Deng, Chen Peng, et al. Cavity ring-down method based performance characterization and defect analysis of large-aperture sampling optics[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202537.240413

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Cavity ring-down method based performance characterization and defect analysis of large-aperture sampling optics

doi: 10.11884/HPLPB202537.240413

Zhou Wenchao^{1, 2},
Ting Deng^{1, 2},
Chen Peng^{1, 2},
Yulong Cao^{1, 2},
Wei Wei^{1, 2},
Siliang Liu^{1, 2},
Wang Jing³

1.
Institute of Applied Electronics, CAEP, Mianyang 621900, China
2.
National key Laboratory of Science and Technology on Advanced Laser and High Power Microwave, Mianyang 621900, China
3.
School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China

Received Date: 2024-12-04
Accepted Date: 2025-04-01
Rev Recd Date: 2025-04-21

Available Online: 2025-05-07

Abstract

Abstract

In high-energy laser systems, the performance parameters of large-aperture sampling optics determine the accuracy of beam testing and evaluation, as well as the precision of overall system performance control. This paper focuses on the performance testing requirements of sampling optics with high-reflectivity (HR) on the front surface and anti-reflectivity (AR) on the back surface. Utilizing the cavity ring-down (CRD) based reflectivity uniformity testing of large-aperture sampling optics, the reflectivity distribution, optical loss, and high-resolution scanning imaging of defects of sampling optics are obtained by scanning measuring the incident light form both the reflective film surface and the anti-reflective film surface, respectively. Furthermore, by comparing and analyzing the defect distribution maps, the classification of defects in the reflective film, transmissive film, and substrate of the sampling optics can be achieved. Finally, by establishing a dual channel CRD system, the residual reflectance distribution of anti-reflective film and the types of defects in the transmissive film were obtained. The testing and analysis method proposed in this paper provides a systematic and comprehensive characterization tool for the performance evaluation and defect analysis of sampling optics.
- sampling optics,
- large-aperture,
- cavity ring-down,
- highly reflective coating,
- anti-reflective coating,
- defect status

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References(16)

References

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