Modeling and calculation of radiation effects of high-energy rays on PCB inside a shielded enclosure

Zhang Yijie; Hao Jianhong; Song Peiyang; Zhang Fang; Fan Jieqing; Zhao Qiang; Xue Bixi; Dong Zhiwei; Hu Gang

doi:10.11884/HPLPB202537.250098

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Zhang Yijie, Hao Jianhong, Song Peiyang, et al. Modeling and calculation of radiation effects of high-energy rays on PCB inside a shielded enclosure[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202537.250098

Citation:

Zhang Yijie, Hao Jianhong, Song Peiyang, et al. Modeling and calculation of radiation effects of high-energy rays on PCB inside a shielded enclosure[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202537.250098

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Modeling and calculation of radiation effects of high-energy rays on PCB inside a shielded enclosure

doi: 10.11884/HPLPB202537.250098

1.
Faculty of Electrical and Electronic Engineering, North China Electric Power University, Beijing 102206, China
2.
Institute of Applied Physics and Computational Mathematics, Beijing 100094, China
3.
Shijiazhuang Educational Science Research Institute, Shijiazhuang 050000, China

Received Date: 2025-04-25
Accepted Date: 2025-08-19
Rev Recd Date: 2025-08-21

Available Online: 2025-09-03

Abstract

Abstract

Background
X/γ-ray irradiation of an electronic system shielding box will penetrate the box body in the various layers of the system surface or internal photoelectron or Compton electrons, and excitation of electromagnetic pulse, these particles or electromagnetic fields will interfere with or even damage the sensitive electronic components of the electronic system inside the box, affecting the regular operation of the electronic system.
Purpose
Rapidly assess the particle and electromagnetic environment inside electronic systems under radiation exposure and enable timely protective measures that mitigate radiation-induced damage and ensure reliable operation.
Methods
We present a theoretical analysis of irradiation responses arising from two coupling mechanisms: electromagnetic pulses excited by primary particles within the cavity of a shielded enclosure and their field-to-circuit coupling to a printed circuit board (PCB), and direct multi-layer penetration coupling of ionizing radiation. Equivalent-circuit models were constructed to represent these coupling paths, and transient current responses were calculated analytically.
Results
The transient current responses of the shielded enclosure under high-energy radiation, computed using the equivalent-circuit approach, reproduce the trends observed in published experimental measurements and exhibit approximate numerical agreement.
Conclusions
The results validate the proposed theoretical modeling approach, showing that analytical equivalent-circuit analysis can provide rapid, simulation-free estimates of radiation effects on electronic systems. The method can be extended to scenarios that more closely match practical applications .
- X/γ-rays,
- radiation effects,
- internal electromagnetic pulse,
- printed circuit boards,
- equivalent circuit

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References(30)

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