Quantum low-perturbation electromagnetic environment testing technology

Zhang Jinhao; Zhao Fengting; Ran Ruibing; An Qiang; Sun Zhanshan

doi:10.11884/HPLPB202537.250153

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Zhang Jinhao, Zhao Fengting, Ran Ruibing, et al. Quantum low-perturbation electromagnetic environment testing technology[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202537.250153

Citation:

Zhang Jinhao, Zhao Fengting, Ran Ruibing, et al. Quantum low-perturbation electromagnetic environment testing technology[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202537.250153

Zhang Jinhao, Zhao Fengting, Ran Ruibing, et al. Quantum low-perturbation electromagnetic environment testing technology[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202537.250153

Citation:

Zhang Jinhao, Zhao Fengting, Ran Ruibing, et al. Quantum low-perturbation electromagnetic environment testing technology[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202537.250153

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Quantum low-perturbation electromagnetic environment testing technology

doi: 10.11884/HPLPB202537.250153

1.
College of Electronic Science and Technology, National University of Defense Technology, Changsha, 410073
2.
63660 Unit of PLA, Luoyang, 471000

Received Date: 2025-05-26
Accepted Date: 2025-08-19
Rev Recd Date: 2025-08-27

Available Online: 2025-09-08

Abstract

Abstract

Background
In complex electromagnetic environments, electronic devices face risks of strong electromagnetic interference, performance degradation and even damage. Accurate acquisition of internal electromagnetic field distribution is a core prerequisite for analyzing field coupling mechanisms, revealing effect principles and evaluating system safety. Traditional metal electric field probes, due to large size and significant disturbance to the measured field, fail to meet fine measurement needs; electro-optic crystal technology, though with low-disturbance advantage, lacks sufficient sensitivity and frequency selectivity in the GHz band. Rydberg atom-based quantum microwave sensing technology, featuring self-calibration, SI unit traceability and high sensitivity, provides a new solution to the above problems.
Purpose
To address the defects of traditional measurement technologies, verify the low-disturbance property of quantum microwave sensing technology, establish an accurate method for measuring internal electric fields of devices, realize high-resolution electromagnetic field distribution mapping, and provide technical support for the analysis and evaluation of complex electromagnetic environment effects.
Methods
The FDTD algorithm was used to compare field disturbance differences between metal probes and Rydberg atomic vapor cells; an experimental system centered on a cesium atomic vapor cell was built, combining electromagnetically induced transparency (EIT) spectroscopy and atomic superheterodyne technology. 45 measurement points with 2cm intervals were set in a square metal shell-simulated device to complete electric field measurement and data processing.
Results
This technology caused minimal disturbance to the measured field, with measurement resolution reaching the millimeter level (<2 mm); in the simulated device, the maximum field intensity was 14.62 mV/m and the minimum was 1.66 mV/m. It had better frequency selectivity than electro-optic crystal technology, and low-field measurement could effectively reduce device damage risks.
Conclusions
Quantum microwave sensing technology can make up for the shortcomings of traditional technologies. Although high-field real-time monitoring requires combining with spectrum matching and its instantaneous bandwidth is narrow, its engineering application feasibility has been verified. Future research can focus on developing simplified measurement schemes for high-field scenarios.
- complex electromagnetic environment testing,
- quantum microwave sensing technology,
- Rydberg atoms,
- low-disturbance measurement,
- high-resolution measurement

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References(32)

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