Multi-layer stacking method to measure high-energy X-ray energy spectrum

The paper proposes an MLS(multi-layer stacking) method to measure the high-energy X-ray energy spectrum．The MLS method has some unique merits: scattering is more easier to control during the measurement; the uniformity of the light field can be more effectively guaranteed; and measurement from different points of view can be realized. The principle of the MLS method is introduced as well as precautions during measurement. For a given X-ray energy spectrum, measuring devices using two different measuring media are designed with Monte Carlo method, and the scattering influence brought about by the devices can be controlled within 5%.